射頻電路系統前瞻測試技術開發(III)

Full metadata record

DC Field	Value	Language
dc.contributor.author	蘇朝琴	en_US
dc.contributor.author	SU CHAU-CHIN	en_US
dc.date.accessioned	2014-12-13T10:31:21Z	-
dc.date.available	2014-12-13T10:31:21Z	-
dc.date.issued	2005	en_US
dc.identifier.govdoc	NSC94-2215-E009-079	zh_TW
dc.identifier.uri	http://hdl.handle.net/11536/90867	-
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=1144047&docId=219425	en_US
dc.description.sponsorship	行政院國家科學委員會	zh_TW
dc.language.iso	zh_TW	en_US
dc.title	射頻電路系統前瞻測試技術開發(III)	zh_TW
dc.title	Advanced Test Technology Development for RF Circuits and Systems(III)	en_US
dc.type	Plan	en_US
dc.contributor.department	交通大學電機與控制工程系	zh_TW
Appears in Collections:	Research Plans

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