完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | 莊紹勳 | en_US |
dc.contributor.author | Chung Steve S | en_US |
dc.date.accessioned | 2014-12-13T10:31:32Z | - |
dc.date.available | 2014-12-13T10:31:32Z | - |
dc.date.issued | 2004 | en_US |
dc.identifier.govdoc | NSC93-2215-E009-026 | zh_TW |
dc.identifier.uri | http://hdl.handle.net/11536/91018 | - |
dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=1026678&docId=195176 | en_US |
dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
dc.language.iso | zh_TW | en_US |
dc.title | 高介電氧化層奈米CMOS元件可靠性關鍵問題及界面量測技術研究(II) | zh_TW |
dc.title | Key Reliability Issues and Interface Characterization Techniques for High-K Nano-CMOS Devices(II) | en_US |
dc.type | Plan | en_US |
dc.contributor.department | 交通大學電子工程系 | zh_TW |
顯示於類別: | 研究計畫 |