以電子背散射繞射儀(EBSD)來研究錫膜的電遷移行為

Title:	以電子背散射繞射儀(EBSD)來研究錫膜的電遷移行為 Study of Electromigration Behavior in Sn Films Using EBSD
Authors:	陳智 Chen Chih 交通大學材料科學與工程系
Issue Date:	2004
Gov't Doc #:	NSC93-2216-E009-018-Y
URI:	http://hdl.handle.net/11536/91087 https://www.grb.gov.tw/search/planDetail?id=913158&docId=172684
Appears in Collections:	Research Plans

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APA	陳., & Chen C. (2004). 以電子背散射繞射儀(EBSD)來研究錫膜的電遷移行為. https://www.grb.gov.tw/search/planDetail?id=913158&docId=172684.
Bibtex	@article{2004, title={以電子背散射繞射儀(EBSD)來研究錫膜的電遷移行為}, author={陳智 and Chen Chih}, journal={https://www.grb.gov.tw/search/planDetail?id=913158&docId=172684}, year={2004}, url={https://ir.lib.nycu.edu.tw/handle/11536/91087}, }