以電子背散射繞射儀(EBSD)來研究錫膜的電遷移行為

Full metadata record

DC Field	Value	Language
dc.contributor.author	陳智	en_US
dc.contributor.author	Chen Chih	en_US
dc.date.accessioned	2014-12-13T10:31:38Z	-
dc.date.available	2014-12-13T10:31:38Z	-
dc.date.issued	2004	en_US
dc.identifier.govdoc	NSC93-2216-E009-018-Y	zh_TW
dc.identifier.uri	http://hdl.handle.net/11536/91087	-
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=913158&docId=172684	en_US
dc.description.sponsorship	行政院國家科學委員會	zh_TW
dc.language.iso	zh_TW	en_US
dc.title	以電子背散射繞射儀(EBSD)來研究錫膜的電遷移行為	zh_TW
dc.title	Study of Electromigration Behavior in Sn Films Using EBSD	en_US
dc.type	Plan	en_US
dc.contributor.department	交通大學材料科學與工程系	zh_TW
Appears in Collections:	Research Plans

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