以電子背散射繞射儀(EBSD)來研究錫膜的電遷移行為

標題:	以電子背散射繞射儀(EBSD)來研究錫膜的電遷移行為 Study of Electromigration Behavior in Sn Films Using EBSD
作者:	陳智 Chen Chih 交通大學材料科學與工程系
公開日期:	2004
官方說明文件#:	NSC93-2216-E009-018-Y
URI:	http://hdl.handle.net/11536/91087 https://www.grb.gov.tw/search/planDetail?id=913158&docId=172684
Appears in Collections:	Research Plans

Files in This Item:

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.