以干涉相位測量法探討對掌物質的特性及其相關應用(II)

Full metadata record

DC Field	Value	Language
dc.contributor.author	蘇德欽	en_US
dc.contributor.author	SU DER-CHIN	en_US
dc.date.accessioned	2014-12-13T10:31:42Z	-
dc.date.available	2014-12-13T10:31:42Z	-
dc.date.issued	2004	en_US
dc.identifier.govdoc	NSC93-2215-E009-021	zh_TW
dc.identifier.uri	http://hdl.handle.net/11536/91115	-
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=1026663&docId=195171	en_US
dc.description.sponsorship	行政院國家科學委員會	zh_TW
dc.language.iso	zh_TW	en_US
dc.title	以干涉相位測量法探討對掌物質的特性及其相關應用(II)	zh_TW
dc.title	Studies on the Characteristics of Chiral Materials with Interferometric Phase Measurement Techniques and Associated Applications(II)	en_US
dc.type	Plan	en_US
dc.contributor.department	交通大學光電工程研究所	zh_TW
Appears in Collections:	Research Plans

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