光學檢測機台之智慧型缺陷識別技術

Full metadata record

DC Field	Value	Language
dc.contributor.author	林錫寬	en_US
dc.contributor.author	LIN SHIR-KUAN	en_US
dc.date.accessioned	2014-12-13T10:31:53Z	-
dc.date.available	2014-12-13T10:31:53Z	-
dc.date.issued	2004	en_US
dc.identifier.govdoc	NSC93-2622-E009-007-CC3	zh_TW
dc.identifier.uri	http://hdl.handle.net/11536/91215	-
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=1032770&docId=196923	en_US
dc.description.sponsorship	行政院國家科學委員會	zh_TW
dc.language.iso	zh_TW	en_US
dc.title	光學檢測機台之智慧型缺陷識別技術	zh_TW
dc.title	Intelligent Defect Recognition in an AOI Machine	en_US
dc.type	Plan	en_US
dc.contributor.department	交通大學電機與控制工程系	zh_TW
Appears in Collections:	Research Plans

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