標題: 砷化鎵高頻元件銅金屬化研究及可靠性評估
The Development of Fully Copper Metallized GaAs High Frequency Devices and the Reliability Study
作者: 張翼
國立交通大學材料科學與工程學系
公開日期: 2003
官方說明文件#: NSC92-2215-E009-069
URI: http://hdl.handle.net/11536/92166
https://www.grb.gov.tw/search/planDetail?id=873569&docId=167365
Appears in Collections:Research Plans


Files in This Item:

  1. 922215E009069.pdf

If it is a zip file, please download the file and unzip it, then open index.html in a browser to view the full text content.