Highly reliable integrated amorphous silicon thin film transistors gate driver

完整後設資料紀錄

DC 欄位	值	語言
dc.contributor.author	Liu, Chin-Wei	en_US
dc.contributor.author	Tai, Ya-Hsiang	en_US
dc.date.accessioned	2014-12-08T15:12:04Z	-
dc.date.available	2014-12-08T15:12:04Z	-
dc.date.issued	2007	en_US
dc.identifier.isbn	978-957-28522-4-8	en_US
dc.identifier.uri	http://hdl.handle.net/11536/9257	-
dc.description.abstract	A reliable shift register consisted of amorphous silicon thin film transistors (a-Si TFTs) is proposed for scan driver circuit of active matrix liquid crystal display (AMLCD). The lifetime of proposed circuit is evaluated based on the reliability measurement data of the a-Si TFTs used and it is estimated to over 5000 hours. Therefore, a highly reliable scanning circuit can be achieved.	en_US
dc.language.iso	en_US	en_US
dc.title	Highly reliable integrated amorphous silicon thin film transistors gate driver	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.journal	IDMC'07: PROCEEDINGS OF THE INTERNATIONAL DISPLAY MANUFACTURING CONFERENCE 2007	en_US
dc.citation.spage	519	en_US
dc.citation.epage	522	en_US
dc.contributor.department	光電工程學系	zh_TW
dc.contributor.department	Department of Photonics	en_US
dc.identifier.wosnumber	WOS:000258177700134	-
顯示於類別：	會議論文