標題: | Performance evaluation of a water mist system in semiconductor wet bench fires |
作者: | Chang, Wen-Yao Fu, Ping-Kun Chen, Chiun-Hsun Shu, Yi-Liang 機械工程學系 Department of Mechanical Engineering |
關鍵字: | water mist;wet bench;semiconductor;fire |
公開日期: | 1-May-2008 |
摘要: | Wet benches are typically utilized in semiconductor facilities for wafer and parts cleaning. Heaters and some flammable liquids, such as acetone and isopropyl alcohol (IPA), are employed during the cleaning process. Wet bench fires have caused serious losses in the semiconductor industry. To assess the fire protection performance, several field tests were performed using a water mist system installed in the wet bench. In this study, acetone pan fuel was used as fire source. The test parameters were operational pressure, pan size, nozzle location, cylinder obstruction and degree of door closure. An appropriate design for operating pressure and the location of water mist nozzles extinguished wet bench fires effectively in the early fire stages. The nozzles are suggested to be fixed above or on the each side of the pan, ensuring that mist can completely cover a pan surface with sufficient momentum. With this suggested design, fires can be extinguished in the pan and do not spread over the wet bench. (c) 2007 The Institution of Chemical Engineers. Published by Elsevier B.V. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.psep.2007.10.013 http://hdl.handle.net/11536/9358 |
ISSN: | 0957-5820 |
DOI: | 10.1016/j.psep.2007.10.013 |
期刊: | PROCESS SAFETY AND ENVIRONMENTAL PROTECTION |
Volume: | 86 |
Issue: | B3 |
起始頁: | 213 |
結束頁: | 218 |
Appears in Collections: | Articles |
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