標題: Performance evaluation of a water mist system in semiconductor wet bench fires
作者: Chang, Wen-Yao
Fu, Ping-Kun
Chen, Chiun-Hsun
Shu, Yi-Liang
機械工程學系
Department of Mechanical Engineering
關鍵字: water mist;wet bench;semiconductor;fire
公開日期: 1-五月-2008
摘要: Wet benches are typically utilized in semiconductor facilities for wafer and parts cleaning. Heaters and some flammable liquids, such as acetone and isopropyl alcohol (IPA), are employed during the cleaning process. Wet bench fires have caused serious losses in the semiconductor industry. To assess the fire protection performance, several field tests were performed using a water mist system installed in the wet bench. In this study, acetone pan fuel was used as fire source. The test parameters were operational pressure, pan size, nozzle location, cylinder obstruction and degree of door closure. An appropriate design for operating pressure and the location of water mist nozzles extinguished wet bench fires effectively in the early fire stages. The nozzles are suggested to be fixed above or on the each side of the pan, ensuring that mist can completely cover a pan surface with sufficient momentum. With this suggested design, fires can be extinguished in the pan and do not spread over the wet bench. (c) 2007 The Institution of Chemical Engineers. Published by Elsevier B.V. All rights reserved.
URI: http://dx.doi.org/10.1016/j.psep.2007.10.013
http://hdl.handle.net/11536/9358
ISSN: 0957-5820
DOI: 10.1016/j.psep.2007.10.013
期刊: PROCESS SAFETY AND ENVIRONMENTAL PROTECTION
Volume: 86
Issue: B3
起始頁: 213
結束頁: 218
顯示於類別:期刊論文


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