標題: 去除次微米微粒之文式洗滌器之基礎研究(III)
Fundamental Study of Venturi Scrubber for Submicron Particle Removal(III)
作者: 蔡春進
Chuen-Jinn Tsai
國立交通大學環境工程研究所
關鍵字: 去除;文氏洗滌器;次微米微粒;流體力學;Removal;Venturi scrubber;Submicron particle;Fluid mechanics
公開日期: 2001
官方說明文件#: NSC90-2211-E009-027
URI: http://hdl.handle.net/11536/94510
https://www.grb.gov.tw/search/planDetail?id=628561&docId=117036
Appears in Collections:Research Plans


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