Title: 以非線性光譜顯微術探討鐵電與鐵磁薄膜的結構與物性(I)
Scanning Nonlinear Optical Spectromicroscopic Studies of Ferroelectric and Ferromagnetic Thin Films (I)
Authors: 黃中垚
JUNG Y.HUANG
交通大學光電工程研究所
Keywords: 克爾效應;掃描探測顯微鏡;鐵電性;鐵磁性;磁域;非線性光學;Kerr effect;Scanning probe microscopy;Ferroelectricity;Ferromagnetism;Magnetic domain;Nonlinear optics
Issue Date: 1999
Gov't Doc #: NSC88-2112-M009-038
URI: http://hdl.handle.net/11536/94547
https://www.grb.gov.tw/search/planDetail?id=428649&docId=76702
Appears in Collections:Research Plans