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dc.contributor.authorHuang, H. W.en_US
dc.contributor.authorLin, C. H.en_US
dc.contributor.authorYu, C. C.en_US
dc.contributor.authorLee, B. D.en_US
dc.contributor.authorChiu, C. H.en_US
dc.contributor.authorLai, C. F.en_US
dc.contributor.authorKuo, H. C.en_US
dc.contributor.authorLeung, K. M.en_US
dc.contributor.authorLu, T. C.en_US
dc.contributor.authorWang, S. C.en_US
dc.date.accessioned2014-12-08T15:12:22Z-
dc.date.available2014-12-08T15:12:22Z-
dc.date.issued2008-04-01en_US
dc.identifier.issn0268-1242en_US
dc.identifier.urihttp://dx.doi.org/10.1088/0268-1242/23/4/045022en_US
dc.identifier.urihttp://hdl.handle.net/11536/9508-
dc.description.abstractThe enhancement of light extraction of gallium nitride (GaN)-based power chip (PC) light-emitting diodes (LEDs) with a p-GaN rough surface by nanoimprint lithography (NIL) is presented. At a driving current of 350 mA and a chip size of 1 mm x 1 mm, the light output power of the PC LEDs with a p-GaN rough surface (etching depth from 130 to 150 nm) showed an enhancement of 24% on wafer when compared with the same device without NIL. Current-voltage results indicated an ohmic contact by the increase in the contact area of the nano-roughened surface at 200 mA. This paper offers a promising potential for enhancing the output powers of commercial LEDs.en_US
dc.language.isoen_USen_US
dc.titleImprovement of light output in GaN-based power chip light-emitting diodes with a nano-rough surface by nanoimprint lithographyen_US
dc.typeArticleen_US
dc.identifier.doi10.1088/0268-1242/23/4/045022en_US
dc.identifier.journalSEMICONDUCTOR SCIENCE AND TECHNOLOGYen_US
dc.citation.volume23en_US
dc.citation.issue4en_US
dc.citation.epageen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000254386300022-
dc.citation.woscount6-
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