A test and diagnosis methodology for RF transceivers

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DC 欄位	值	語言
dc.contributor.author	Chen, Hung-kai	en_US
dc.contributor.author	Su, Chauchin	en_US
dc.date.accessioned	2014-12-08T15:12:51Z	-
dc.date.available	2014-12-08T15:12:51Z	-
dc.date.issued	2007	en_US
dc.identifier.isbn	978-0-7695-2890-8	en_US
dc.identifier.issn	1081-7735	en_US
dc.identifier.uri	http://hdl.handle.net/11536/9900	-
dc.identifier.uri	http://dx.doi.org/10.1109/ATS.2007.29	en_US
dc.description.abstract	This paper proposes an RF test and diagnosis methodology based on digital DFT structure and built-in DSP function of a SoC Chip. Constellation variation plots are proposed to identify the faulty component. Furthermore, linear interpolation is used to determine the amount of variation. The simulated test results show that the method is able to identify not only the faulty component but also the variation amount precise.	en_US
dc.language.iso	en_US	en_US
dc.subject	RF test	en_US
dc.subject	RF design-for-testability	en_US
dc.subject	mixer	en_US
dc.subject	low noise amplifier	en_US
dc.subject	transceiver	en_US
dc.title	A test and diagnosis methodology for RF transceivers	en_US
dc.type	Proceedings Paper	en_US
dc.identifier.doi	10.1109/ATS.2007.29	en_US
dc.identifier.journal	PROCEEDINGS OF THE 16TH ASIAN TEST SYMPOSIUM	en_US
dc.citation.spage	135	en_US
dc.citation.epage	138	en_US
dc.contributor.department	電控工程研究所	zh_TW
dc.contributor.department	Institute of Electrical and Control Engineering	en_US
dc.identifier.wosnumber	WOS:000252080600023	-
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