| Title: | 異質接面電晶體的安全操作範圍研究(I) Study of Ruggedness and the Safe Operating Area of GaAs Based Heterojunction Bipolar Transistors (I) |
| Authors: | 李建平 LEE CHIEN-PING 國立交通大學電子工程學系及電子研究所 |
| Issue Date: | 2013 |
| Gov't Doc #: | NSC102-2221-E009-093 |
| URI: | http://hdl.handle.net/11536/99650 https://www.grb.gov.tw/search/planDetail?id=3088165&docId=415541 |
| Appears in Collections: | Research Plans |
- 異質接面電晶體的安全操作範圍研究( III ) / 李建平;LEE CHIEN-PING
- 異質接面電晶體的安全操作範圍研究 (II) / 李建平;LEE CHIEN-PING
- Study on mechanisms of InGaP/GaAs HBT safe operating area using TCAD simulation / Tao, Nick G. M.;Lin, Bo-Rong;Lee, Chien-Ping;Henderson, Tim;Lin, Barry J. F.
- Studies of Safe Operating Area of InGaP/GaAs Heterojunction Bipolar Transistors / Lee, Chien-Ping;Tao, Nick G. M.;Lin, Barry Jia-Fu
- 2D Numerical Simulation for InGaP/GaAs HBT Safe Operating Area / Lin, Bo-Rong;Tao, Nick G. M.;Lee, Chien-Ping;Henderson, Tim;Lin, Barry J. F.
- 異質接面電晶體的安全操作範圍研究(I) / 李建平;LEE CHIEN-PING
- The safe operating area of GaAs-based heterojunction bipolar transistors / Lee, Chien-Ping;Chati, Frank H. E.;Ma, Wenlong;Wang, Nanlei Larry
Loading...