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IMPROVEMENT ON THE CURRENT-VOLTAGE CHARACTERISTICS OF POLYCRYSTALLINE SILICON CONTACTED N+-P JUNCTIONS WITH HIGH-FIELD STRESSING

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Date

1990-03-12

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DOI

10.1063/1.102606

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http://dx.doi.org/10.1063/1.102606
 https://ir.lib.nycu.edu.tw/handle/11536/4156

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期刊論文;;Articles

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