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單晶片系統驗證之核心技術開發---子計畫六:針對先進晶片設計的熱點驗證之完整熱模型與高效能熱分析(III)
單晶片系統驗證之核心技術開發---子計畫六:針對先進晶片設計的熱點驗證之完整熱模型與高效能熱分析(III)
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962220E009012.PDF
(2.24 MB)
Date
2007
Authors
李育民
LEE YU-MIN
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https://www.grb.gov.tw/search/planDetail?id=1462772&docId=262096
https://ir.lib.nycu.edu.tw/handle/11536/102954
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