ANALYSIS OF THE DX TRAPS INDUCED TRANSIENT CHARACTERISTICS IN ALGAAS GAAS HEMTS
| dc.citation.epage | 1087 | en_US |
| dc.citation.issue | 8 | en_US |
| dc.citation.spage | 1081 | en_US |
| dc.citation.volume | 33 | en_US |
| dc.citation.woscount | 1 | |
| dc.contributor.author | WANG, TH | en_US |
| dc.contributor.author | YU, CC | en_US |
| dc.contributor.department | 交大名義發表 | zh_TW |
| dc.contributor.department | 電控工程研究所 | zh_TW |
| dc.contributor.department | National Chiao Tung University | en_US |
| dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:05:32Z | |
| dc.date.available | 2014-12-08T15:05:32Z | |
| dc.date.issued | 1990-08-01 | en_US |
| dc.identifier.doi | 10.1016/0038-1101(90)90223-2 | en_US |
| dc.identifier.issn | 0038-1101 | en_US |
| dc.identifier.journal | SOLID-STATE ELECTRONICS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1016/0038-1101(90)90223-2 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/4057 | |
| dc.identifier.wosnumber | WOS:A1990DR88700016 | |
| dc.language.iso | en_US | en_US |
| dc.title | ANALYSIS OF THE DX TRAPS INDUCED TRANSIENT CHARACTERISTICS IN ALGAAS GAAS HEMTS | en_US |
| dc.type | Article | en_US |
Files
License bundle
1 - 1 of 1
Loading...
- Name:
- license.txt
- Size:
- 1.71 KB
- Format:
- Item-specific license agreed to upon submission
- Description: