Skip to main content
Log In
Communities & Collections
All of DSpace
Statistics
Home
學術出版;;Publications
會議論文;;Conferences Paper
Mechanisms and characteristics of oxide charge detrapping in n-MOSFET's
Mechanisms and characteristics of oxide charge detrapping in n-MOSFET's
Loading...
Date
1996
Authors
Wang, TH
Chang, TE
Chiang, LP
Huang, CM
Guo, JC
Journal Title
Journal ISSN
Volume Title
Publisher
DOI
Abstract
Description
Keywords
Citation
URI
https://ir.lib.nycu.edu.tw/handle/11536/19878
Collections
會議論文;;Conferences Paper
Endorsement
Review
Supplemented By
Referenced By
Full item page
