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學術出版;;Publications
期刊論文;;Articles
THE EFFECTS OF THERMAL NITRIDATION CONDITIONS ON THE RELIABILITY OF THIN NITRIDED OXIDE-FILMS
THE EFFECTS OF THERMAL NITRIDATION CONDITIONS ON THE RELIABILITY OF THIN NITRIDED OXIDE-FILMS
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A1987G609400006.pdf
(282.02 KB)
Date
1987-04-01
Authors
TSAI, HH
WU, LC
WU, CY
HU, CM
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https://ir.lib.nycu.edu.tw/handle/11536/4649
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