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學術出版;;Publications
會議論文;;Conferences Paper
Accurate MOS device hot carrier models for VLSI reliability simulation
Accurate MOS device hot carrier models for VLSI reliability simulation
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A1995BD31E00051.pdf
(310.54 KB)
Date
1995
Authors
CHUNG, SS
YANG, JJ
SU, JS
Journal Title
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Volume Title
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DOI
10.1109/CICC.1995.518175
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http://dx.doi.org/10.1109/CICC.1995.518175
https://ir.lib.nycu.edu.tw/handle/11536/20003
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