Enhanced Carrier-Mobility-Fluctuation Origin Low-Frequency Noise in Uniaxial Strained PMOSFETs
| dc.citation.epage | 499 | en_US |
| dc.citation.issue | 5 | en_US |
| dc.citation.spage | 497 | en_US |
| dc.citation.volume | 31 | en_US |
| dc.citation.woscount | 2 | |
| dc.contributor.author | Kuo, Jack J. -Y. | en_US |
| dc.contributor.author | Chen, William P. -N. | en_US |
| dc.contributor.author | Su, Pin | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2014-12-08T15:06:58Z | |
| dc.date.available | 2014-12-08T15:06:58Z | |
| dc.date.issued | 2010-05-01 | en_US |
| dc.description.abstract | This letter reports our new findings on the impact of uniaxial strain on the low-frequency-noise characteristics in nanoscale PMOSFETs. It is found that the normalized drain current noise of the strained device in the high-gate-overdrive (V(gst)) regime is larger than its control counterpart. In addition, the enhanced carrier-mobility- fluctuation origin 1/f noise for the strained device in the high-vertical bar V(gst)vertical bar regime indicates that the carrier mobility in the strained device is more phonon limited, which represents an intrinsic strain effect on the low-frequency noise. | en_US |
| dc.identifier.doi | 10.1109/LED.2010.2044138 | en_US |
| dc.identifier.issn | 0741-3106 | en_US |
| dc.identifier.journal | IEEE ELECTRON DEVICE LETTERS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1109/LED.2010.2044138 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/5453 | |
| dc.identifier.wosnumber | WOS:000277047300039 | |
| dc.language.iso | en_US | en_US |
| dc.subject | Carrier mobility fluctuation | en_US |
| dc.subject | low-frequency noise | en_US |
| dc.subject | process-induced strain | en_US |
| dc.subject | uniaxial strained PMOSFET | en_US |
| dc.title | Enhanced Carrier-Mobility-Fluctuation Origin Low-Frequency Noise in Uniaxial Strained PMOSFETs | en_US |
| dc.type | Article | en_US |