後次微米時代新興電子設計自動化技術之研究---子計畫三：角落錯誤之矽除錯(III)
| dc.contributor.author | 周景揚 | en_US |
| dc.contributor.author | JOU JING-YANG | en_US |
| dc.contributor.department | 國立交通大學電子工程學系及電子研究所 | zh_TW |
| dc.date.accessioned | 2014-12-13T10:46:03Z | |
| dc.date.available | 2014-12-13T10:46:03Z | |
| dc.date.issued | 2010 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.identifier.govdoc | NSC99-2220-E009-010 | zh_TW |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=2158798&docId=347423 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/100617 | |
| dc.language.iso | zh_TW | en_US |
| dc.subject | 除錯 | zh_TW |
| dc.subject | 矽除錯 | zh_TW |
| dc.subject | 可偵錯度 | zh_TW |
| dc.subject | 角落錯誤 | zh_TW |
| dc.subject | 錯誤區域辨識 | zh_TW |
| dc.subject | 錯誤候選邏輯閘排序 | zh_TW |
| dc.subject | 錯誤診斷架構 | zh_TW |
| dc.subject | 聚焦離子束 | zh_TW |
| dc.subject | 版圖調整 | zh_TW |
| dc.subject | 可移動訊號候選排序 | zh_TW |
| dc.subject | Debug | en_US |
| dc.subject | Silicon debug | en_US |
| dc.subject | Diagnosibility | en_US |
| dc.subject | Hard-corner errors | en_US |
| dc.subject | Faulty-region identification | en_US |
| dc.subject | Fault-candidate ranking | en_US |
| dc.subject | Fault diagnosis architecture | en_US |
| dc.subject | Focused-ion-beam | en_US |
| dc.subject | Layout adjustment | en_US |
| dc.subject | moving-signal candidate ranking | en_US |
| dc.title | 後次微米時代新興電子設計自動化技術之研究---子計畫三：角落錯誤之矽除錯(III) | zh_TW |
| dc.title | Silicon Debug for Hard-Corner Design Errors | en_US |
| dc.type | Plan | en_US |