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GROWTH OF SINGLE-CRYSTALLINE COSI2 ON (111) SI IN SOLID-PHASE EPITAXY REGIME BY A NON-ULTRAHIGH VACUUM METHOD

dc.citation.epage176en_US
dc.citation.issue4en_US
dc.citation.spage174en_US
dc.citation.volume50en_US
dc.citation.woscount11
dc.contributor.authorCHENG, HCen_US
dc.contributor.authorWU, ICen_US
dc.contributor.authorCHEN, LJen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:06:06Z
dc.date.available2014-12-08T15:06:06Z
dc.date.issued1987-01-26en_US
dc.identifier.doi10.1063/1.97652en_US
dc.identifier.issn0003-6951en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.97652en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/4668
dc.identifier.wosnumberWOS:A1987F694200002
dc.language.isoen_USen_US
dc.titleGROWTH OF SINGLE-CRYSTALLINE COSI2 ON (111) SI IN SOLID-PHASE EPITAXY REGIME BY A NON-ULTRAHIGH VACUUM METHODen_US
dc.typeArticleen_US

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