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學術出版;;Publications
期刊論文;;Articles
CHARACTERIZATION OF MONOLITHIC POLYCRYSTALLINE-SILICON RESISTORS IN SUB-MICRON THICKNESS
CHARACTERIZATION OF MONOLITHIC POLYCRYSTALLINE-SILICON RESISTORS IN SUB-MICRON THICKNESS
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Date
1982
Authors
LU, NCC
LU, CY
LEE, MK
SHIH, CC
WANG, CS
SHENG, TT
REUTER, W
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https://ir.lib.nycu.edu.tw/handle/11536/4986
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