Browsing by Author "LEE, MK"
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Item type:Item, BELT TRANSPORT CVD PROCESSING(1983) ;LEE, MK ;LU, CY ;SHIH, CT ;電控工程研究所Institute of Electrical and Control EngineeringItem type:Item, CHARACTERIZATION OF MONOLITHIC POLYCRYSTALLINE-SILICON RESISTORS IN SUB-MICRON THICKNESS(1982) ;LU, NCC ;LU, CY ;LEE, MK ;SHIH, CCWANG, CSItem type:Item, GROWTH-KINETICS OF SILICON THERMAL NITRIDATION(1982) ;WU, CY ;KING, CW ;LEE, MK ;CHEN, CT電控工程研究所Item type:Item, ON THE RESISTANCE SWITCHING IN POLYCRYSTALLINE-SILICON RESISTORS(1983-01-01) ;LU, CY ;LU, NCC ;SHIH, CC ;LEE, MKWANG, CSItem type:Item, ON THE RESISTANCE SWITCHING IN POLYCRYSTALLINE-SILICON RESISTORS(1983-01-01) ;LU, CY ;LU, NCC ;SHIH, CC ;LEE, MKWANG, CSItem type:Item, ON THE SEMI-INSULATING POLYCRYSTALLINE SILICON RESISTOR(1984) ;LEE, MK ;LU, CY ;CHANG, KZ ;SHIH, C電控工程研究所Item type:Item, OXIDATION RESISTANCE CHARACTERISTICS OF SILICON THERMAL NITRIDE FILMS(1983) ;WU, CY ;KING, CW ;LEE, MK ;CHEN, CTSHIH, CTItem type:Item, SI OXIDATION IN O2-N2 IN THE PRESENCE OF HCL(1981) ;LEE, MK ;LIU, SD ;LEE, CL ;奈米中心Nano Facility CenterItem type:Item, STUDY OF ELECTRICAL CHARACTERISTICS ON THERMALLY NITRIDED SIO2 (NITROXIDE) FILMS(1984) ;CHEN, CT ;TSENG, FC ;CHANG, CY ;LEE, MK電控工程研究所Item type:Item, THE DIELECTRIC RELIABILITY OF INTRINSIC THIN SIO2-FILMS THERMALLY GROWN ON A HEAVILY DOPED SI SUBSTRATE - CHARACTERIZATION AND MODELING(1987-07-01) ;CHEN, CF ;WU, CY ;LEE, MK ;CHEN, CN工學院Item type:Item, THE EFFECT OF FILM THICKNESS ON THE ELECTRICAL-PROPERTIES OF LPCVD POLYSILICON FILMS(1984) ;LU, NCC ;LU, CY ;LEE, MK ;SHIH, CCWANG, CSItem type:Item, THE EFFECT OF GATE ELECTRODES USING TUNGSTEN SILICIDES AND OR POLYSILICON ON THE DIELECTRIC CHARACTERISTICS OF VERY THIN OXIDES(1990-03-01) ;CHENG, HC ;CHAO, CY ;SU, WD ;CHANG, SWLEE, MK