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Issue DateTitleAuthor(s)
2008Characterization of device degradation of poly-Si TFTs under dynamic operation with drain biasedTai, Ya-Hsiang; Huang, Shih-Che; Chan, Chang-Lung; 光電工程學系; Department of Photonics
1-Sep-2013Characterization of environment-dependent hysteresis in indium gallium zinc oxide thin film transistorsChen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Chung, Wan-Fang; Chen, Shih-Cheng; Wu, Chang-Pei; Chen, Yi-Hsien; Tai, Ya-Hsiang; Tseng, Tseung-Yuen; Yeh(Huang), Fon-Shan; 電子工程學系及電子研究所; 光電工程學系; 顯示科技研究所; Department of Electronics Engineering and Institute of Electronics; Department of Photonics; Institute of Display
1-Aug-2008Characterization of poly-Si TFT variation using interdigitated methodHuang, Shih-Che; Tai, Ya-Hsiang; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-Mar-2010Characterization of the Channel-Shortening Effect on P-Type Poly-Si TFTsTai, Ya-Hsiang; Huang, Shih-Che; Chen, Po-Ting; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-Apr-2013Charge Quantity Influence on Resistance Switching Characteristic During Forming ProcessChu, Tian-Jian; Chang, Ting-Chang; Tsai, Tsung-Ming; Wu, Hsing-Hua; Chen, Jung-Hui; Chang, Kuan-Chang; Young, Tai-Fa; Chen, Kai-Hsang; Syu, Yong-En; Chang, Geng-Wei; Chang, Yao-Feng; Chen, Min-Chen; Lou, Jyun-Hao; Pan, Jhih-Hong; Chen, Jian-Yu; Tai, Ya-Hsiang; Ye, Cong; Wang, Hao; Sze, Simon M.; 電子工程學系及電子研究所; 光電工程學系; Department of Electronics Engineering and Institute of Electronics; Department of Photonics
1-Mar-2011Charge-Trapping-Induced Parasitic Capacitance and Resistance in SONOS TFTs Under Gate Bias StressLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Li, Hung-Wei; Chen, Shih-Ching; Chuang, Ying-Shao; Chen, Te-Chih; Tai, Ya-Hsiang; Lee, Ming-Hsien; Chen, Jim-Shone; 光電工程學系; Department of Photonics
Apr-2016The Current Behaviors of the Amorphous In-Ga-Zn-O Thin-Film Transistor Under Varying Illumination ConditionsTai, Ya-Hsiang; Chang, Chun-Yi; Chen, Ya-Wei; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-Mar-2009Degradation Mechanism of Poly-Si TFTs Dynamically Operated in OFF RegionTai, Ya-Hsiang; Huang, Shih-Che; Chen, Po-Ting; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
2010Degradation of Low Temperature Polycrystalline Silicon Thin Film Transistors under Negative Bias Temperature Instability Stress with Illumination EffectLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Hsu, Wei-Che; Chen, Shih-Ching; Tai, Ya-Hsiang; Jian, Fu-Yen; Chen, Te-Chih; Tu, Kuan-Jen; Wu, Hsing-Hua; Chen, Yi-Chan; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
2007Degradation of the capacitance-voltage behaviors of the low-temperature polysilicon TFTs under DC stressTai, Ya-Hsiang; Huang, Shih-Che; Lin, Chien Wen; Chiu, Hao Lin; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-Dec-2008Dependence of Photosensitive Effect on the Defects Created by DC Stress for LTPS TFTsTai, Ya-Hsiang; Kuo, Yan-Fu; Lee, Yun-Hsiang; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-Feb-2014Dependence of the Noise Behavior on the Drain Current for Thin Film TransistorsTai, Ya-Hsiang; Chang, Chun-Yi; Hsieh, Chung-Lun; Yang, Yung-Hsuan; Chao, Wei-Kuang; Chen, Huan-Ean; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-Apr-2015Design and Simulation of the Pixel Circuit for a 6-in Full HD LTPS TFT LCD Based on the New Digital Driving MethodTai, Ya-Hsiang; Chang, Chun-Yi; Lin, Chun-Yu; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
2012The Deterioration of a-IGZO TFTs Owing to the Copper Diffusion after the Process of the Source/Drain Metal FormationTai, Ya-Hsiang; Chiu, Hao-Lin; Chou, Lu-Sheng; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
2005Diverse instability behaviors for n-channel low-temperature polycrystalline silicon thin film transistorsYu, Cheng-Ho; Tai, Ya-Hsiang; Teng, Te-Hung; 光電工程學系; Department of Photonics
Dec-2016Drain Current Response to Fast Illumination Pulse for Amorphous In-Ga-Zn-O Thin-Film TransistorsTai, Ya-Hsiang; Chang, Chun-Yi; Chan, Po-Chun; Dai, Jhih-Jie; 交大名義發表; 光電工程學系; National Chiao Tung University; Department of Photonics
2007Dynamic stress effects on the reliability of poly-Si TFTKuo, Yan-Fu; Huang, Shih-Che; Shih, Wei-Lun; Tai, Ya-Hsiang; 光電工程學系; Department of Photonics
1-Oct-2011Effect of Lateral Body Terminal on Silicon-Oxide-Nitride-Oxide-Silicon Thin-Film TransistorsLi, Hung-Wei; Chang, Ting-Chang; Chang, Geng-Wei; Lin, Chia-Sheng; Tsai, Tsung-Ming; Jian, Fu-Yen; Tai, Ya-Hsiang; Lee, Ming-Hsien; 電子工程學系及電子研究所; 光電工程學系; 顯示科技研究所; Department of Electronics Engineering and Institute of Electronics; Department of Photonics; Institute of Display
Jul-2016Effects of Illumination on the Noise Behavior of Amorphous Indium Gallium Zinc Oxide Thin Film TransistorsTai, Ya-Hsiang; Chang, Chun-Yi; Hsieh, Chung-Lun; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
2011Effects of Post-Deposition Annealing Atmosphere and Duration on Sol-Gel Derived Amorphous Indium-Zinc-Oxide Thin Film TransistorsChung, Wan-Fang; Chang, Ting-Chang; Li, Hung-Wei; Tseng, Tseung-Yuen; Tai, Ya-Hsiang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
Showing results 21 to 40 of 165 < previous   next >