瀏覽 的方式: 作者 Lin, HC

跳到: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
或是輸入前幾個字:  
顯示 41 到 60 筆資料,總共 132 筆 < 上一頁   下一頁 >
公開日期標題作者
2003FGS-based video streaming test bed for MPEG-21 universal multimedia access with digital item adaptationWang, CN; Tsai, CY; Lin, HC; Chaung, HC; Lin, YC; Chen, JH; Tong, KL; Chang, FC; Tsai, CJ; Lee, SY; Chiang, TH; Hang, HM; 資訊工程學系; Department of Computer Science
1-八月-2000Fused-ring and linking group effects of proton donors and accepters on simple H-bonded liquid crystalsLin, HC; Shiaws, JM; Wu, CY; Tsai, CT; 材料科學與工程學系; Department of Materials Science and Engineering
15-十二月-1997Growth and X-ray characterization of an InN film on sapphire prepared by metalorganic vapor phase epitaxyChen, WK; Pan, YC; Lin, HC; Ou, J; Chen, WH; Lee, MC; 電子物理學系; Department of Electrophysics
15-十二月-1997Growth and X-ray characterization of an InN film on sapphire prepared by metalorganic vapor phase epitaxyChen, WK; Pan, YC; Lin, HC; Ou, J; Chen, WH; Lee, MC; 電子物理學系; Department of Electrophysics
1-十二月-2003H-2 and NH3 plasma passivation on poly-Si TFTs with bottom-sub-gate induced electrical junctionsYu, CM; Lin, HC; Huang, TY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2001H-bonded effects on supramolecular liquid crystalline trimers containing photoluminescent coresLin, HC; Sheu, HY; Chang, CL; Tsai, CT; 材料科學與工程學系; Department of Materials Science and Engineering
1-二月-2003High-performance P-channel Schottky-barrier SOI FinFET featuring self-aligned PtSi source/drain and electrical junctionsLin, HC; Wang, MF; Hou, FJ; Lin, HN; Lu, CY; Liu, JT; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-2006High-performance TFTs with Si nanowire channels enhanced by metal-induced lateral crystallizationSu, CJ; Lin, HC; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-1999A high-temperature thermodynamic model for metalorganic vapor phase epitaxial growth of InGaNOu, J; Pan, YC; Lee, WH; Shu, CK; Lin, HC; Lee, MC; Chen, WH; Chiang, CI; Chang, H; Chen, WK; 電子物理學系; Department of Electrophysics
1-七月-1999Highly (111) textured titanium nitride layers for sub- quarter-micrometer Al metallizationWu, WF; Lin, CC; Huang, CC; Lin, HC; Chang, TC; Yang, RP; Huang, TY; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics
1-九月-1996Highly selective etching for polysilicon and etch-induced damage to gate oxide with halogen-bearing electron-cyclotron-resonance plasmaChang, KM; Yeh, TH; Deng, IC; Lin, HC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2004Hot carrier degradations of dynamic threshold silicon on insulator p-type metal-oxide-semiconductor field effect transistorsChao, TS; Lee, YJ; Huang, CY; Lin, HC; Li, YM; Huang, TY; 電子物理學系; 電子工程學系及電子研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
15-二月-2006Hydrogen bonding interactions and miscibility between phenolic resin and octa(acetoxystyryl) polyhedral oligomeric silsesquioxane (AS-POSS) nanocompositesKuo, SW; Lin, HC; Huang, WJ; Huang, CF; Chang, FC; 應用化學系; Department of Applied Chemistry
1-二月-2002Impact of thermal stability on the characteristics of complementary metal oxide semiconductor transistors with TiN metal gateWang, MF; Huang, TY; Kao, YC; Lin, HC; Chang, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005The impact of uniaxial strain engineering on channel backscattering in nanoscale MOSFETsLin, HN; Chen, HW; Ko, CH; Ge, CH; Lin, HC; Huang, TY; Lee, WC; Tang, DD; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2003Impacts of HF etching on ultra-thin core gate oxide integrity in dual gate oxide CMOS technologyLee, DY; Lin, HC; Chen, CL; Huang, TY; Wang, TH; Lee, TL; Chen, SC; Liang, MS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2006Impacts of uniaxial compressive strain on dynamic negative bias temperature instability of p-channel MOSFETsLu, CY; Lin, HC; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-1997Improved flash cell performance by N2O annealing of interpoly oxideJong, FC; Huang, TY; Chao, TS; Lin, HC; Leu, LY; Young, K; Lin, CH; Chiu, KY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2000Improved immunity to plasma damage in ultrathin nitrided oxidesChen, CC; Lin, HC; Chang, CY; Liang, MS; Chien, CH; Hsien, SK; Huang, TY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2000Improved plasma charging immunity in ultra-thin gate oxide with fluorine and nitrogen implantationChen, CC; Lin, HC; Chang, CY; Huang, CC; Chien, CH; Huang, TY; Liang, MS; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics