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公開日期標題作者
1-四月-2016Simple bare gold nanoparticles for rapid colorimetric detection of Cr3+ ions in aqueous medium with real sample applicationsShellaiah, Muthaiah; Simon, Turibius; Sun, Kien Wen; Ko, Fu-Hsiang; 材料科學與工程學系; 應用化學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Applied Chemistry; Department of Electronics Engineering and Institute of Electronics
1-五月-2019A simple extraction method for parasitic series resistances in GaN HEMTs considering non-quasi-static effectsNagarajan, Venkatesan; Chen, Kun-Ming; Wang, Huan-Chung; Singh, Sankalp Kumar; Anandan, Deepak; Lin, Yueh-Chin; Chang, Edward Yi; 材料科學與工程學系; 電子工程學系及電子研究所; Department of Materials Science and Engineering; Department of Electronics Engineering and Institute of Electronics
1-十二月-1996A simple fabrication process of T-shaped gates using a deep-UV/electron-beam/deep-UV tri-layer resist system and electron-beam lithographyLai, YL; Chang, EY; Chang, CY; Yang, HPD; Nakamura, K; Shy, SL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2010A simple method for sub-100 nm pattern generation with I-line double-patterning techniqueTsai, Tzu-I; Lin, Horng-Chih; Jian, Min-Feng; Huang, Tiao-Yuan; Chao, Tien-Sheng; 電子物理學系; 電子工程學系及電子研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
1-九月-2008A simple method to characterize the afterpulsing effect in single photon avalanche photodiodeYen, H. T.; Lin, S. D.; Tsai, C. M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2008A simple model for cavity enhanced slow lights in vertical cavity surface emission lasersChou, Chia-Sheng; Lee, Ray-Kuang; Peng, Peng-Chun; Kuo, Hao-Chung; Lin, Gray; Yang, Hung-Ping; Chi, Jim Y.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2000A simple processor core design for DCT/IDCTChang, TS; Kung, CS; Jen, CW; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1985A SIMPLE PUNCHTHROUGH VOLTAGE MODEL FOR SHORT-CHANNEL MOSFETS WITH SINGLE CHANNEL IMPLANTATION IN VLSIWU, CY; HSIAO, WZ; CHEN, HH; 工學院; 電子工程學系及電子研究所; College of Engineering; Department of Electronics Engineering and Institute of Electronics
1-十一月-2007A simple Spacer technique to fabricate poly-Si TFTs with 50-nm nanowire channelsChang, Chia-Wen; Deng, Chih-Kang; Chang, Hong-Ren; Chang, Che-Lun; Lei, Tan-Fu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2004A simple transmission line de-embedding method for accurate RF CMOS noise modelingGuo, JC; Huang, CH; Lien, WY; Wu, CM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-1985SIMPLE TREATMENT OF THE ENHANCEMENT OF RAMAN-SCATTERING DUE TO A 2-DIMENSIONAL ARRAY OF METALLIC SPHEROIDSCHU, LC; WANG, SY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1979SIMPLIFIED APPROACH TO THE CURRENT-VOLTAGE CHARACTERISTICS OF THE P+NP+ DIODE BELOW REACH-THROUGHYU, SY; THOMAS, G; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-1994SIMPLIFYING SEQUENTIAL-CIRCUIT TEST-GENERATIONSHEU, ML; LEE, CL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2018Simulation Analysis of Structure Design for Low Temperature Cu-Cu Direct Bonding in Heterogeneous Integration and Advanced Packaging SystemsPan, Yu-Ming; Yang, Yu-Tao; Chou, Tzu-Chieh; Yu, Ting-Yang; Yang, Kai-Ming; Ko, Cheng-Ta; Chen, Yu-Hua; Tseng, Tzyy-Jang; Chen, Kuan-Neng; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
15-十月-1997Simulation and analysis of the capacitance-voltage characteristics of the delta-doped semiconductorsLiu, DG; Lee, CP; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
15-十月-1997Simulation and analysis of the capacitance-voltage characteristics of the delta-doped semiconductorsLiu, DG; Lee, CP; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2014Simulation and Investigation of Random Grain-Boundary-Induced Variabilities for Stackable NAND Flash Using 3-D Voronoi Grain PatternsYang, Ching-Wei; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2014SIMULATION OF ELECTRIC FIELD DISTRIBUTION IN CMOS SINGLE PHOTON AVALANCHE DIODES AT BREAKDOWN VOLTAGEWu, Jau-Yang; Lin, Sheng-Di; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2012Simulation of Grain-Boundary Induced V-th Variability in Stackable NAND Flash Using a Voronoi ApproachYang, Ching-Wei; Chao, Shao-Heng; Su, Pin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2014Simulation of Grain-Boundary Traps Effect for 3D Vertical Gate NAND Flash Memory Cell : From Structure Geometry to Trap DescriptionWang, Pei-Yu; Tsui, Bing-Yue; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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