Browsing by Author Lai, CH

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
or enter first few letters:  
Showing results 1 to 20 of 22  next >
Issue DateTitleAuthor(s)
15-Apr-2006Anisotropy transition of Co in IrMn/Co/FeOx/Co by field coolingShen, CT; Lai, CH; Huang, PH; Hsu, SY; Chung, TY; 電子物理學系; Department of Electrophysics
2002DSP-embedded UPS controller for high-performance single-phase on-line UPS systemsLai, CH; Tzou, YY; 電控工程研究所; Institute of Electrical and Control Engineering
1-Aug-2002Formation of Ni germano-silicide on single crystalline Si0.3Ge0.7/SiLin, CY; Chen, WJ; Lai, CH; Chin, A; Liu, J; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Apr-2002Frequency-dependent capacitance reduction in high-k AlTiOx and Al2O3 gate dielectrics from IF to RF frequency rangeChen, SB; Lai, CH; Chan, KT; Chin, A; Hsieh, JC; Liu, J; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
15-May-2003High interfacial exchange energy in TbFeCo exchange-bias filmsLin, CC; Lai, CH; Jiang, RF; Shieh, HPD; 光電工程學系; Department of Photonics
1-Apr-2002High-density MIM capacitors using Al2O3 and AlTiOx dielectricsChen, SB; Lai, CH; Chin, A; Hsieh, JC; Liu, J; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jul-2001Magnetic properties and recording characteristics of high magnetization exchange-coupled double-layer TbFeCo for magnetic flux reading optical recordingChen, BM; Lai, CH; Shieh, HPD; 光電工程學系; Department of Photonics
2004Mining the change of events in environmental scanning for decision supportShih, MJ; Liu, DR; Liau, C; Lai, CH; 資訊管理與財務金融系 註:原資管所+財金所; Department of Information Management and Finance
1-Mar-2005A novel program-erasable high-(K) A1N-Si MIS capacitorLai, CH; Chin, A; Hung, BF; Cheng, CF; Yoo, WJ; Li, MF; Zhu, CX; McAlister, SP; Kwong, DL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Novel SiO2/AlN/HfAlO/IrO2 memory with fast erase, large triangle V-th and good retentionLai, CH; Chin, A; Chiang, KC; Yoo, WJ; Cheng, CF; McAlister, SP; Chi, CC; Wu, P; 電機學院; College of Electrical and Computer Engineering
1-Jun-2001Positive giant magnetoresistance in ferrimagnetic/Cu/ferrimagnetic filmsLai, CH; Lin, CC; Chen, BM; Shieh, HPD; Chang, CR; 光電工程學系; Department of Photonics
2006A quantum trap MONOS memory device using AlNLai, CH; Wu, CH; Chin, A; Wang, SJ; McAlister, SP; 奈米科技中心; Center for Nanoscience and Technology
1-May-2005Reoxidation behavior of high-nitrogen oxynitride films after O(2) and N(2)O treatmentLin, BC; Chang, KM; Lai, CH; Hsieh, KY; Yao, JM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-May-2005Reoxidation behavior of high-nitrogen oxynitride films after O-2 and N2O treatmentLin, BC; Chang, KM; Lai, CH; Hsieh, KY; Yao, JM; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2002RF MIM capacitors using high-K Al2O3 and AlTiOx dielectricsChen, SB; Lai, CH; Chin, A; Hsieh, JC; Liu, J; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Dec-2002RF noise in 0.18-mu m and 0.13-mu m MOSFETsHuang, CH; Lai, CH; Hsieh, JC; Liu, J; Chin, A; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jun-2006Robust ultrathin oxynitride with high nitrogen diffusion barrier near its surface formed by NH3 nitridation of chemical oxide and reoxidation with O-2Lai, CH; Lin, BC; Chang, KM; Hsieh, KY; Lai, YL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Jun-2004Thickness dependence of Co anisotropy in TbFe/Co exchange-coupled bilayersLin, CC; Lai, CH; Wei, DH; Hsu, YJ; Shieh, HPD; 光電工程學系; Department of Photonics
2004A tunable and program-erasable capacitor on Si with excellent tuning memoryLai, CH; Lee, CF; Chin, A; Zhu, C; Li, MF; McAlister, SP; Kwong, DL; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Very high density RF MIM capacitor compatible with VLSIChiang, KC; Lai, CH; Chin, A; Kao, HL; McAlister, SP; Chi, CC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics