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Showing results 1 to 7 of 7
Issue DateTitleAuthor(s)
1-May-2004Andreev scattering in semiconductor-superconductor junctions containing a finite width semiconductor region applied by magnetic fieldsHsue, YC; Yang, TJ; Gu, BY; Wang, J; 電子物理學系; Department of Electrophysics
1-Nov-2002Improving the electrical integrity of Cu-CoSi2 contacted n(+)p junction diodes using nitrogen-incorporated Ta films as a diffusion barrierYang, WL; Wu, WF; You, HC; Ou, KL; Lei, TF; Chou, CP; 機械工程學系; 電子物理學系; Department of Mechanical Engineering; Department of Electrophysics
1-Sep-2017Reduced Junction Leakage by Hot Phosphorus Ion Implantation of NiGe-Contacted Germanium n(+)/p Shallow JunctionChen, Yi-Ju; Tsui, Bing-Yue; Chou, Hung-Ju; Li, Ching-I; Lin, Ger-Pin; Hu, Shao-Yu; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Feb-2002Reduction of nickel-silicided junction leakage by nitrogen ion implantationChao, TS; Lee, LY; 電子物理學系; Department of Electrophysics
2010以分子動力學方式研究分子接面的熱傳導性質吳佳翰; Wu, Chia-Han; 陳煜璋; Chen, Yu-Chang; 電子物理系所
2008於鍺基板製作n+-p型二極體及n型金氧半場效電晶體之電性研究林敬倫; Ching-Lun Lin; 簡昭欣; Chao-Hsin Chien; 電子研究所
2016閘極低介面缺陷的高介電係數堆疊以及鈀鍺合金對鍺元件之研究石安石; 簡昭欣; 林炯源; Shih, An-Shih; Chien, Chao-Hsin; Lin, Chiung-Yuan; 電子研究所
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