1. 目前位置：

瀏覽 的方式： 作者 Chang, Chi-Min

跳到： 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
或是輸入前幾個字：  
顯示 1 到 6 筆資料，總共 6 筆
公開日期標題作者
1-五月-2014Fast Transistor Threshold Voltage Measurement Method for High-Speed, High-Accuracy Advanced Process CharacterizationLuo, Tseng-Chin; Chao, Mango C. -T.; Tseng, Huan-Chi; Goto, Masaharu; Fisher, Philip A.; Chang, Yuan-Yao; Chang, Chi-Min; Takao, Takayuki; Iwasaki, Katsuhito; Lee, Cheng Mao; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2014Fast Transistor Threshold Voltage Measurement Method for High-Speed, High-Accuracy Advanced Process CharacterizationLuo, Tseng-Chin; Chao, Mango C. -T.; Tseng, Huan-Chi; Goto, Masaharu; Fisher, Philip A.; Chang, Yuan-Yao; Chang, Chi-Min; Takao, Takayuki; Iwasaki, Katsuhito; Lee, Cheng Mao; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十二月-2011A Novel Test Flow for One-Time-Programming Applications of NROM TechnologyChao, Mango C. -T.; Chin, Ching-Yu; Tsou, Yao-Te; Chang, Chi-Min; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2009A Novel Test Flow for One-Time-Programming Applications of NROM TechnologyChin, Ching-Yu; Tsou, Yao-Te; Chang, Chi-Min; Chao, Mango C. -T.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2012Testing Methodology of Embedded DRAMsYang, Hao-Yu; Chang, Chi-Min; Chao, Mango C. -T.; Huang, Rei-Fu; Lin, Shih-Chin; 交大名義發表; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electronics Engineering and Institute of Electronics
2008Testing Methodology of Embedded DRAMsChang, Chi-Min; Chao, Mango C. -T.; Huang, Rei-Fu; Chen, Ding-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
顯示 1 到 6 筆資料，總共 6 筆