標題: A Novel Test Flow for One-Time-Programming Applications of NROM Technology
作者: Chao, Mango C. -T.
Chin, Ching-Yu
Tsou, Yao-Te
Chang, Chi-Min
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: NROM;repair rate estimation;test flow
公開日期: 1-十二月-2011
摘要: The NROM technology is an emerging non-volatile-memory technology providing high data density with low fabrication cost. In this paper, we propose a novel test flow for the one-time-programming (OTP) applications using the NROM bit cells. Unlike the conventional test flow, the proposed flow applies the repair analysis in its package test instead of in its wafer test, and hence creates a chance for reusing the bit cells originally identified as a defect to represent the value in the OTP application. Thus, the proposed test flow can reduce the number of bit cells to be repaired and further improve the yield. Also, we propose an efficient and effective estimation scheme to predict the probability of a part being successfully repaired before packaged. This estimation can be used to determine whether a part should be packaged, such that the total profit of the proposed test flow can be optimized. A series of experiments are conducted to demonstrate the effectiveness, efficiency, and feasibility of the proposed test flow.
URI: http://dx.doi.org/10.1109/TVLSI.2010.2087044
http://hdl.handle.net/11536/14628
ISSN: 1063-8210
DOI: 10.1109/TVLSI.2010.2087044
期刊: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS
Volume: 19
Issue: 12
起始頁: 2170
結束頁: 2183
顯示於類別:期刊論文


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