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公開日期標題作者
2004Influence of annealing sequence on p(+)/n junction images studied by scanning capacitance microscopyChang, MN; Wan, WW; Chen, CY; Lai, JH; Liang, JH; Pan, FM; 材料科學與工程學系; Department of Materials Science and Engineering
2005Investigation of localized breakdown spots in thin SiO(2) using scanning capacitance microscopyWang, SD; Chang, MN; Chen, CY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2001An investigation of scanning capacitance microscopy on iron-contaminated p-type siliconChang, MN; Chang, TY; Pan, FM; Wu, BW; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-八月-2002Observation of differential capacitance images on slightly iron-contaminated p-type siliconChang, MN; Chen, CY; Pan, FM; Chang, TY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2005Observation of localized breakdown spots in thin SiO2 films using scanning capacitance microscopyWang, SD; Chang, MN; Chen, CY; Lei, TF; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-1997Porous silicon light-emitting diode with tunable colorChen, YA; Chen, BF; Tsay, WC; Laih, LH; Chang, MN; Chyi, JI; Hong, JW; Chang, CY; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2004Selective growth of carbon nanotube on scanning probe tips by microwave plasma chemical vapor depositionPan, FM; Liu, YB; Chang, Y; Chen, CY; Tsai, TG; Chang, MN; Sheu, JT; 材料科學與工程學系; Department of Materials Science and Engineering
28-二月-2005Variations of differential capacitance in SrBi2Ta2O9 ferroelectric films induced by photoperturbationLeu, CC; Chien, CH; Chen, CY; Chang, MN; Hsu, FY; Hu, CT; Chen, YF; 電子物理學系; Department of Electrophysics
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