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Issue DateTitleAuthor(s)
1-Nov-1997An application of non-normal process capability indicesChen, KS; Pearn, WL; 工業工程與管理學系; Department of Industrial Engineering and Management
1996A Bayesian-like estimator of C-pkPearn, WL; Chen, KS; 工業工程與管理學系; Department of Industrial Engineering and Management
15-Nov-2004Behavior and surface energies of polybenzoxazines formed by polymerization with argon, oxygen, and hydrogen plasmasChen, JK; Lin, IK; Ko, FH; Huang, CF; Chen, KS; Chan, CH; Chang, FC; 應用化學系; Department of Applied Chemistry
2004The C ''(pk) index for asymmetric tolerances: Implications and inferencePearn, WL; Lin, PC; Chen, KS; 工業工程與管理學系; Department of Industrial Engineering and Management
2002Capability evaluation of a product family for processes of the larger-the-better typeChen, KS; Li, RK; Liao, SJ; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Dec-1997Capability indices for non-normal distributions with an application in electrolytic capacitor manufacturingPearn, WL; Chen, KS; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Sep-2001Capability indices for processes with asymmetric tolerancesChen, KS; Pearn, WL; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Mar-2003Capability measures for processes with multiple characteristicsChen, KS; Pearn, WL; Lin, PC; 工業工程與管理學系; Department of Industrial Engineering and Management
30-Apr-2005Characterization and conductive coating of phosphors for improved brightnessChang, CH; Chiou, BS; Chen, KS; Ho, JC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-Sep-2005Contract manufacturer selection by using the process incapability index C-ppChen, KS; Chen, KL; Li, RK; 工業工程與管理學系; Department of Industrial Engineering and Management
1998Distributional and inferential properties of the process accuracy and process precision indicesPearn, WL; Lin, GH; Chen, KS; 工業工程與管理學系; Department of Industrial Engineering and Management
2005The effect of In2O3 conductive coating on the luminescence and zeta potential of ZnS : Cu, Al phosphorsChang, CH; Chiou, BS; Chen, KS; Ho, CC; Ho, JC; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2001Estimating process capability index C"(pmk) for asymmetric tolerances: Distributional propertiesPearn, WL; Lin, PC; Chen, KS; 工業工程與管理學系; Department of Industrial Engineering and Management
2005A gold-free fully copper-metallized InP heterojunction bipolar transistor using non-alloyed ohmic contact and platinum diffusion barrierChang, SW; Chang, EY; Lee, CS; Chen, KS; Tseng, CW; Tu, YY; Lee, CT; 材料科學與工程學系; Department of Materials Science and Engineering
1-Jan-2005Gold-free fully cu-metallized InGaP/GaAs heterojunction bipolar transistorChang, SW; Chang, EY; Biswas, D; Lee, CS; Chen, KS; Tseng, CW; Hsieh, TL; Wu, WC; 材料科學與工程學系; Department of Materials Science and Engineering
1-Oct-2005Graphical analysis of capability of a process producing a product familyHuang, ML; Chen, KS; Li, RK; 工業工程與管理學系; Department of Industrial Engineering and Management
2003A low noise composite-channel metamorphic HEMT for wireless communication applicationsLu, CY; Chen, KS; Lee, HM; Chang, EY; Chen, SH; Lin, YC; Chen, GJ; 材料科學與工程學系; Department of Materials Science and Engineering
1-Jul-1999Making decisions in assessing process capability index C-pkPearn, WL; Chen, KS; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Dec-1998New generalization of process capability index C-pkPearn, WL; Chen, KS; 工業工程與管理學系; Department of Industrial Engineering and Management
1-Dec-1998New generalization of process capability index C-pkPearn, WL; Chen, KS; 工業工程與管理學系; Department of Industrial Engineering and Management
Showing results 1 to 20 of 26  next >