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顯示 1 到 17 筆資料，總共 17 筆
公開日期標題作者
2010Analysis of Anomalous Capacitance Induced by TAGIDL in p-Channel LTPS TFTsLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Ching; Jian, Fu-Yen; Chuang, Ying-Shao; Chen, Te-Chih; Chen, Yu-Chun; Tai, Ya-Hsiang; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-十二月-2010Analysis of Degradation Mechanism in SONOS-TFT Under Hot-Carrier OperationChen, Te-Chih; Chang, Ting-Chang; Chen, Shih-Ching; Hsieh, Tien-Yu; Jian, Fu-Yen; Lin, Chia-Sheng; Li, Hung-Wei; Lee, Ming-Hsien; Chen, Jim-Shone; Shih, Ching-Chieh; 光電工程學系; Department of Photonics
1-十一月-2009Anomalous Capacitance Induced by GIDL in P-Channel LTPS TFTsLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Chen, Shih-Ching; Jian, Fu-Yen; Li, Hung-Wei; Chen, Te-Chih; Weng, Chi-Feng; Lu, Jin; Hsu, Wei-Che; 光電工程學系; Department of Photonics
21-三月-2011Anomalous on-current and subthreshold swing improvement in low-temperature polycrystalline-silicon thin-film transistors under Gate bias stressLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Li, Hung-Wei; Chen, Yi-Chuan; Chen, Te-Chih; Tai, Ya-Hsiang; 電子工程學系及電子研究所; 光電工程學系; 顯示科技研究所; Department of Electronics Engineering and Institute of Electronics; Department of Photonics; Institute of Display
1-三月-2011Charge-Trapping-Induced Parasitic Capacitance and Resistance in SONOS TFTs Under Gate Bias StressLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Li, Hung-Wei; Chen, Shih-Ching; Chuang, Ying-Shao; Chen, Te-Chih; Tai, Ya-Hsiang; Lee, Ming-Hsien; Chen, Jim-Shone; 光電工程學系; Department of Photonics
2010Degradation of Low Temperature Polycrystalline Silicon Thin Film Transistors under Negative Bias Temperature Instability Stress with Illumination EffectLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Hsu, Wei-Che; Chen, Shih-Ching; Tai, Ya-Hsiang; Jian, Fu-Yen; Chen, Te-Chih; Tu, Kuan-Jen; Wu, Hsing-Hua; Chen, Yi-Chan; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
2009Illumination-Assisted Negative Bias Temperature Instability Degradation in Low Temperature Polycrystalline Silicon Thin-Film TransistorsLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Hsu, Wei-Che; Chen, Shih-Ching; Li, Hung-Wei; Tu, Kuan-Jen; Jian, Fu-Yen; Chen, Te-Chih; 光電工程學系; Department of Photonics
1-九月-2013Improvement in the bias stability of amorphous InGaZnO TFTs using an Al2O3 passivation layerHuang, Sheng-Yao; Chang, Ting-Chang; Chen, Min-Chen; Chen, Te-Chih; Jian, Fu-Yen; Chen, Yu-Chun; Huang, Hui-Chun; Gan, Der-Shin; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2012Investigating Degradation Behavior of InGaZnO Thin-Film Transistors induced by Charge-Trapping Effect under DC and AC Gate-Bias StressHsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
11-七月-2011Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistorChen, Te-Chih; Chang, Ting-Chang; Hsieh, Tien-Yu; Lu, Wei-Siang; Jian, Fu-Yen; Tsai, Chih-Tsung; Huang, Sheng-Yao; Lin, Chia-Sheng; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2013Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environmentsHsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
25-十月-2017Mechanism of a-IGZO TFT device deterioration-illumination light wavelength and substrate temperature effectsChen, Te-Chih; Kuo, Yue; Chang, Ting-Chang; Chen, Min-Chen; Chen, Hua-Mao; 光電工程學系; Department of Photonics
1-七月-2011NBTI Degradation in LTPS TFTs Under Mechanical Tensile StrainLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Hsu, Wei-Che; Kuo, Yuan-Jui; Dai, Chih-Hao; Chen, Te-Chih; Lo, Wen-Hung; Hsieh, Tien-Yu; Shih, Jou-Miao; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十二月-2017Stability of double gate amorphous In-Ga-Zn-O thin-film transistors with various top gate designsChen, Te-Chih; Kuo, Yue; Chang, Ting-Chang; Chen, Min-Chen; Chen, Hua-Mao; 光電工程學系; Department of Photonics
26-十一月-2012The suppressed negative bias illumination-induced instability in In-Ga-Zn-O thin film transistors with fringe field structureChen, Yu-Chun; Chang, Ting-Chang; Li, Hung-Wei; Hsieh, Tien-Yu; Chen, Te-Chih; Wu, Chang-Pei; Chou, Cheng-Hsu; Chung, Wang-Cheng; Chang, Jung-Fang; Tai, Ya-Hsiang; 光電工程學系; Department of Photonics
2011Transient Effect Assisted NBTI Degradation in p-Channel LTPS TFTs under Dynamic StressLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Ching; Hsu, Wei-Che; Jian, Fu-Yen; Chen, Te-Chih; Tai, Ya-Hsiang; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
2010Unusual Threshold Voltage Shift Caused by Self-Heating-Induced Charge Trapping EffectJian, Fu-Yen; Chang, Ting-Chang; Chu, An-Kuo; Chen, Te-Chih; Chen, Shih-Ching; Lin, Chia-Sheng; Li, Hung-Wei; Lee, Ming-Hsien; Chen, Jim-Shone; Shih, Ching-Chieh; 光電工程學系; Department of Photonics
顯示 1 到 17 筆資料，總共 17 筆