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公開日期標題作者
1-十一月-2019Abnormal C-V Hump Effect Induced by Hot Carriers in Gate Length-Dependent p-Type LTPS TFTsHuang, Shin-Ping; Chen, Po-Hsun; Tsao, Yu-Ching; Chen, Hong-Chih; Zheng, Yu-Zhe; Chu, Ann-Kuo; Shih, Yu-Shan; Wang, Yu-Xuan; Wu, Chia-Chuan; Shih, Yao-Kai; Chung, Yu-Hua; Chen, Wei-Han; Wang, Terry Tai-Jui; Zhang, Sheng-Dong; Chang, Ting-Chang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
30-十二月-2011Charge trapping induced frequency-dependence degradation in n-MOSFETs with high-k/metal gate stacksDai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Hung, Ya-Chi; Lo, Wen-Hung; Ho, Szu-Han; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Chen, Hua-Mao; Dai, Bai-Shan; Tsai, Tsung-Ming; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
14-四月-2014Dual operation characteristics of resistance random access memory in indium-gallium-zinc-oxide thin film transistorsYang, Jyun-Bao; Chang, Ting-Chang; Huang, Jheng-Jie; Chen, Yu-Chun; Chen, Yu-Ting; Tseng, Hsueh-Chih; Chu, Ann-Kuo; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-八月-2020Effect of ELA Energy Density on Self-Heating Stress in Low-Temperature Polycrystalline Silicon Thin-Film TransistorsHuang, Shin-Ping; Chen, Hong-Chih; Chen, Po-Hsun; Zheng, Yu-Zhe; Chu, Ann-Kuo; Shih, Yu-Shan; Wang, Yu-Xuan; Wu, Chia-Chuan; Chen, Yu-An; Sun, Pei-Jun; Huang, Hui-Chun; Lai, Wei-Chih; Chang, Ting-Chang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十二月-2016Effect of SiO2 Buffer Layer Thickness on Performance and Reliability of Flexible Polycrystalline Silicon TFTs Fabricated on PolyimideChen, Bo-Wei; Chang, Ting-Chang; Hung, Yu-Ju; Huang, Shin-Ping; Chen, Hua-Mao; Huang, Hui-Chun; Liao, Po-Yung; Chiang, Hsiao-Cheng; Zheng, Yu-Zhe; Yeh, Wei-Heng; Lin, Yu-Ho; Liang, Jonathan Siher; Chu, Ann-Kuo; Li, Hung-Wei; Tsai, Chih-Hung; Lu, Hsueh-Hsing; 光電工程學系; Department of Photonics
八月-2016Effects of Repetitive Mechanical Bending Strain on Various Dimensions of Foldable Low Temperature Polysilicon TFTs Fabricated on PolyimideChen, Bo-Wei; Chang, Ting-Chang; Hung, Yu-Ju; Huang, Shin-Ping; Liao, Po-Yung; Yang, Chung-Yi; Chu, Ann-Kuo; Wang, Terry Tai-Jui; Chang, Tsu-Chiang; Su, Bo-Yuan; Kuo, Su-Chun; Huang, I-Yu; 電子物理學系; Department of Electrophysics
1-十二月-2017Efficient wavelength conversion with low operation power in a Ta2O5-based micro-ring resonatorWu, Chung-Lun; Huang, Jen-Yang; Ou, Ding-Hsin; Liao, Ting-Wei; Chiu, Yi-Jen; Shih, Min-Hsiung; Lin, Yuan-Yao; Chu, Ann-Kuo; Lee, Chao-Kuei; 光電工程學系; Department of Photonics
1-六月-2019An Energy-Band Model for Dual-Gate-Voltage Sweeping in Hydrogenated Amorphous Silicon Thin-Film TransistorsChen, Guan-Fu; Chen, Hong-Chih; Chang, Ting-Chang; Huang, Shin-Ping; Chen, Hua-Mao; Liao, Po-Yung; Chen, Jian-Jie; Kuo, Chuan-Wei; Lai, Wei-Chih; Chu, Ann-Kuo; Lin, Sung-Chun; Yeh, Cheng-Yen; Chang, Chia-Sen; Tsai, Cheng-Ming; Yu, Ming-Chang; Zhang, Shengdong; 光電工程學系; Department of Photonics
25-十一月-2010Enhanced gate-induced floating-body effect in PD SOI MOSFET under external mechanical strainDai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Chen, Shih-Ching; Tsai, Chih-Tsung; Lo, Wen-Hung; Ho, Szu-Han; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-五月-2020Enhancement of Mechanical Bending Stress Endurance Using an Organic Trench Structure in Foldable Polycrystalline Silicon TFTsZheng, Yu-Zhe; Huang, Shin-Ping; Chen, Po-Hsun; Chang, Ting-Chang; Tsai, Tsung-Ming; Chu, Ann-Kuo; Hung, Yang-Hao; Shih, Yu-Shan; Wang, Yu-Xuan; Wu, Chia-Chuan; Tu, Yu-Fa; Chen, Yu-An; Sun, Pei-Jun; Chung, Yu-Hua; Chen, Wei-Han; Wang, Tai-Jui; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
22-七月-2013Enhancement of the stability of resistive switching characteristics by conduction path reconstructionHuang, Jheng-Jie; Chang, Ting-Chang; Yu, Chih-Cheng; Huang, Hui-Chun; Chen, Yu-Ting; Tseng, Hsueh-Chih; Yang, Jyun-Bao; Sze, Simon M.; Gan, Der-Shin; Chu, Ann-Kuo; Lin, Jian-Yang; Tsai, Ming-Jinn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
4-七月-2011Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistorsDai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2012Hot Carrier Effect on Gate-Induced Drain Leakage Current in n-MOSFETs with HfO2/Ti1-xNx Gate StacksDai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2019Impact of Dehydrogenation Annealing Process Temperature on Reliability of Polycrystalline Silicon Thin Film TransistorsHuang, Shin-Ping; Chen, Po-Hsun; Chen, Hong-Chih; Zheng, Yu-Zhe; Chu, Ann-Kuo; Tsao, Yu-Ching; Shih, Yu-Shan; Wang, Yu-Xuan; Wu, Chia-Chuan; Lai, Wei-Chih; Chang, Ting-Chang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-2013Impact of Electroforming Current on Self-Compliance Resistive Switching in an ITO/Gd:SiOx/TiN StructureTseng, Hsueh-Chih; Chang, Ting-Chang; Wu, Yi-Chun; Wu, Sei-Wei; Huang, Jheng-Jie; Chen, Yu-Ting; Yang, Jyun-Bao; Lin, Tzu-Ping; Sze, Simon. M.; Tsai, Ming-Jinn; Wang, Ying-Lang; Chu, Ann-Kuo; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
28-二月-2011Impact of static and dynamic stress on threshold voltage instability in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistorsDai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Lo, Wen-Hung; Ho, Szu-Han; Chen, Ching-En; Shih, Jou-Miao; Chen, Hua-Mao; Dai, Bai-Shan; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
21-十月-2014Influence of an anomalous dimension effect on thermal instability in amorphous-InGaZnO thin-film transistorsLiu, Kuan-Hsien; Chang, Ting-Chang; Chou, Wu-Ching; Chen, Hua-Mao; Tsai, Ming-Yen; Wu, Ming-Siou; Hung, Yi-Syuan; Hung, Pei-Hua; Hsieh, Tien-Yu; Tai, Ya-Hsiang; Chu, Ann-Kuo; Yeh, Bo-Liang; 電子物理學系; 電子工程學系及電子研究所; 光電工程學系; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics; Department of Photonics
15-一月-2013Influence of forming process on resistance switching characteristics of In2O3/SiO2 bi-layerHuang, Jheng-Jie; Chang, Ting-Chang; Yang, Po-Chun; Chen, Yu-Ting; Tseng, Hsueh-Chih; Yang, Jyun-Bao; Sze, Simon M.; Chu, Ann-Kuo; Tsai, Ming-Jinn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
28-一月-2013Influence of molybdenum doping on the switching characteristic in silicon oxide-based resistive switching memoryChen, Yu-Ting; Chang, Ting-Chang; Huang, Jheng-Jie; Tseng, Hsueh-Chih; Yang, Po-Chun; Chu, Ann-Kuo; Yang, Jyun-Bao; Huang, Hui-Chun; Gan, Der-Shin; Tsai, Ming-Jinn; Sze, Simon M.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2012Influence of Oxygen Concentration on Resistance Switching Characteristics of Gallium OxideHuang, Jheng-Jie; Chang, Ting-Chang; Yang, Jyun-Bao; Chen, Shih-Ching; Yang, Po-Chun; Chen, Yu-Ting; Tseng, Hsueh-Chih; Sze, Simon M.; Chu, Ann-Kuo; Tsai, Ming-Jinn; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
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