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公開日期標題作者
三月-2017A Comprehensive Characterization Method for Lateral Profiling of Interface Traps and Trapped Charges in P-SONOS Cell DevicesGuo, Jyh-Chyurn; Du, Pei-Ying; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2006P-channel SONOS transient current modeling for program and eraseDu, Pei-Ying; Guo, Jyh-Chyurn; Lee, H. M.; Chen, H. M.; Shen, Rick; Hsu, C. C. -H.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-四月-2009Pulse-IV Characterization of Charge-Transient Behavior of SONOS-Type Devices With or Without a Thin Tunnel OxideDu, Pei-Ying; Lue, Hang-Ting; Wang, Szu-Yu; Huang, Tiaci-Yuan; Hsieh, Kuang-Yeu; Liu, Rich; Lu, Chih-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2015A Study of Blocking and Tunnel Oxide Engineering on Double-Trapping (DT) BE-SONOS PerformanceLo, Roger; Du, Pei-Ying; Hsu, Tzu-Hsuan; Wu, Chen-Jun; Guo, Jung-Yi; Cheng, Chun-Min; Lue, Hang-Ting; Shih, Yen-Hao; Hou, Tuo-Hung; Hsieh, Kuang-Yeu; Lu, Chih-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2009STUDY OF GATE-INJECTION OPERATED SONOS-TYPE DEVICES USING THE GATE-SENSING AND CHANNEL-SENSING (GSCS) METHODDu, Pei-Ying; Lue, Hang-Ting; Wang, Szu-Yu; Huang, Tiao-Yuan; Hsieh, Kuang-Yeu; Liu, Rich; Lu, Chih-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-八月-2008A study of gate-sensing and channel-sensing (GSCS) transient analysis method - Part II: Study of the intra-nitride behaviors and reliability of SONOS-type devicesDu, Pei-Ying; Lue, Hang-Ting; Wang, Szu-Yu; Huang, Tiao-Yuan; Hsieh, Kuang-Yeu; Liu, Rich; Lu, Chih-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2007Study of the gate-sensing and channel-sensing transient analysis method for monitoring the charge vertical location of SONOS-type devicesDu, Pei-Ying; Lue, Hang-Ting; Wang, Szu-Yu; Lai, Erh-Kun; Huang, Tiao-Yuan; Hsieh, Kuang-Yeu; Liu, Rich; Lu, Chih-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-一月-2018Study of Thyristor-Mode Dual-Channel NAND Flash DevicesLo, Roger; Lue, Hang-Ting; Chen, Weichen; Du, Pei-Ying; Hsu, Tzu-Hsuan; Hou, Tuo-Hung; Wang, Keh-Chung; Lu, Chih-Yuan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2008以閘極感應與通道感應方法與脈衝電流電壓技術分析SONOS類型元件中捕捉電荷之特性杜姵瑩; Du, Pei-Ying; 黃調元; 呂函庭; Huang, Tiao-Yuan; Lue, Hang-Ting; 電子研究所
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