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國立陽明交通大學機構典藏
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顯示 1 到 19 筆資料,總共 19 筆
公開日期
標題
作者
1-十二月-2014
Abnormal temperature-dependent floating-body effect on Hot-Carrier Degradation in PDSOI n-MOSFETs
Liu, Kuan-Ju
;
Chang, Ting-Chang
;
Yang, Ren-Ya
;
Chen, Ching-En
;
Ho, Szu-Han
;
Tsai, Jyun-Yu
;
Hsieh, Tien-Yu
;
Cheng, Osbert
;
Huang, Cheng-Tung
;
電機工程學系
;
Department of Electrical and Computer Engineering
1-十二月-2010
Analysis of Degradation Mechanism in SONOS-TFT Under Hot-Carrier Operation
Chen, Te-Chih
;
Chang, Ting-Chang
;
Chen, Shih-Ching
;
Hsieh, Tien-Yu
;
Jian, Fu-Yen
;
Lin, Chia-Sheng
;
Li, Hung-Wei
;
Lee, Ming-Hsien
;
Chen, Jim-Shone
;
Shih, Ching-Chieh
;
光電工程學系
;
Department of Photonics
2013
Analysis of Electrical Characteristics and Reliability Change of Zinc-Tin-Oxide Thin-Film Transistors by Photo-Thermal Treatment
Chen, Yu-Chun
;
Chang, Ting-Chang
;
Li, Hung-Wei
;
Chung, Wan-Fang
;
Hsieh, Tien-Yu
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
2013
Dependence of Light-Accelerated Instability on Bias and Environment in Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistors
Chen, Yu-Chun
;
Chang, Ting-Chang
;
Li, Hung-Wei
;
Chung, Wan-Fang
;
Hsieh, Tien-Yu
;
Chen, Yi-Hsien
;
Tsai, Wu-Wei
;
Chiang, Wen-Jen
;
Yan, Jing-Yi
;
光電工程學系
;
Department of Photonics
6-三月-2017
The effect of asymmetrical electrode form after negative bias illuminated stress in amorphous IGZO thin film transistors
Su, Wan-Ching
;
Chang, Ting-Chang
;
Liao, Po-Yung
;
Chen, Yu-Jia
;
Chen, Bo-Wei
;
Hsieh, Tien-Yu
;
Yang, Chung-I
;
Huang, Yen-Yu
;
Chang, Hsi-Ming
;
Chiang, Shin-Chuan
;
Chang, Kuan-Chang
;
Tsai, Tsung-Ming
;
電子物理學系
;
Department of Electrophysics
10-四月-2017
The effect of asymmetrical electrode form after negative bias illuminated stress in amorphous IGZO thin film transistors (vol 110, 103502, 2017)
Su, Wan-Ching
;
Chang, Ting-Chang
;
Liao, Po-Yung
;
Chen, Yu-Jia
;
Chen, Bo-Wei
;
Hsieh, Tien-Yu
;
Yang, Chung-I
;
Huang, Yen-Yu
;
Chang, Hsi-Ming
;
Chiang, Shin-Chuan
;
Chang, Kuan-Chang
;
Tsai, Tsung-Ming
;
電子物理學系
;
Department of Electrophysics
15-五月-2017
The effect of device electrode geometry on performance after hot-carrier stress in amorphous In-Ga-Zn-O thin film transistors with different via-contact structures
Liao, Po-Yung
;
Chang, Ting-Chang
;
Chen, Yu-Jia
;
Su, Wan-Ching
;
Chen, Bo-Wei
;
Chen, Li-Hui
;
Hsieh, Tien-Yu
;
Yang, Chung-Yi
;
Chang, Kuan-Chang
;
Zhang, Sheng-Dong
;
Huang, Yen-Yu
;
Chang, Hsi-Ming
;
Chiang, Shin-Chuan
;
電子物理學系
;
Department of Electrophysics
十二月-2016
Effect of mechanical-strain-induced defect generation on the performance of flexible amorphous In-Ga-Zn-O thin-film transistors
Liao, Po-Yung
;
Chang, Ting-Chang
;
Su, Wan-Ching
;
Chen, Yu-Jia
;
Chen, Bo-Wei
;
Hsieh, Tien-Yu
;
Yang, Chung-Yi
;
Huang, Yen-Yu
;
Chang, Hsi-Ming
;
Chiang, Shin-Chuan
;
電子物理學系
;
Department of Electrophysics
4-七月-2011
Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors
Dai, Chih-Hao
;
Chang, Ting-Chang
;
Chu, Ann-Kuo
;
Kuo, Yuan-Jui
;
Ho, Szu-Han
;
Hsieh, Tien-Yu
;
Lo, Wen-Hung
;
Chen, Ching-En
;
Shih, Jou-Miao
;
Chung, Wan-Lin
;
Dai, Bai-Shan
;
Chen, Hua-Mao
;
Xia, Guangrui
;
Cheng, Osbert
;
Huang, Cheng Tung
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
2012
Hot Carrier Effect on Gate-Induced Drain Leakage Current in n-MOSFETs with HfO2/Ti1-xNx Gate Stacks
Dai, Chih-Hao
;
Chang, Ting-Chang
;
Chu, Ann-Kuo
;
Kuo, Yuan-Jui
;
Ho, Szu-Han
;
Hsieh, Tien-Yu
;
Lo, Wen-Hung
;
Chen, Ching-En
;
Shih, Jou-Miao
;
Chung, Wan-Lin
;
Dai, Bai-Shan
;
Chen, Hua-Mao
;
Xia, Guangrui
;
Cheng, Osbert
;
Huang, Cheng Tung
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
26-六月-2017
Impact of repeated uniaxial mechanical strain on flexible a-IGZO thin film transistors with symmetric and asymmetric structures
Liao, Po-Yung
;
Chang, Ting-Chang
;
Su, Wan-Ching
;
Chen, Bo-Wei
;
Chen, Li-Hui
;
Hsieh, Tien-Yu
;
Yang, Chung-Yi
;
Chang, Kuan-Chang
;
Zhang, Sheng-Dong
;
Huang, Yen-Yu
;
Chang, Hsi-Ming
;
Chiang, Shin-Chuan
;
電子物理學系
;
Department of Electrophysics
21-十月-2014
Influence of an anomalous dimension effect on thermal instability in amorphous-InGaZnO thin-film transistors
Liu, Kuan-Hsien
;
Chang, Ting-Chang
;
Chou, Wu-Ching
;
Chen, Hua-Mao
;
Tsai, Ming-Yen
;
Wu, Ming-Siou
;
Hung, Yi-Syuan
;
Hung, Pei-Hua
;
Hsieh, Tien-Yu
;
Tai, Ya-Hsiang
;
Chu, Ann-Kuo
;
Yeh, Bo-Liang
;
電子物理學系
;
電子工程學系及電子研究所
;
光電工程學系
;
Department of Electrophysics
;
Department of Electronics Engineering and Institute of Electronics
;
Department of Photonics
2012
Investigating Degradation Behavior of InGaZnO Thin-Film Transistors induced by Charge-Trapping Effect under DC and AC Gate-Bias Stress
Hsieh, Tien-Yu
;
Chang, Ting-Chang
;
Chen, Te-Chih
;
Tsai, Ming-Yen
;
Chen, Yu-Te
;
Jian, Fu-Yen
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
11-七月-2011
Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor
Chen, Te-Chih
;
Chang, Ting-Chang
;
Hsieh, Tien-Yu
;
Lu, Wei-Siang
;
Jian, Fu-Yen
;
Tsai, Chih-Tsung
;
Huang, Sheng-Yao
;
Lin, Chia-Sheng
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
31-三月-2014
Investigation of channel width-dependent threshold voltage variation in a-InGaZnO thin-film transistors
Liu, Kuan-Hsien
;
Chang, Ting-Chang
;
Wu, Ming-Siou
;
Hung, Yi-Syuan
;
Hung, Pei-Hua
;
Hsieh, Tien-Yu
;
Chou, Wu-Ching
;
Chu, Ann-Kuo
;
Sze, Simon M.
;
Yeh, Bo-Liang
;
電子物理學系
;
電子工程學系及電子研究所
;
Department of Electrophysics
;
Department of Electronics Engineering and Institute of Electronics
1-九月-2013
Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments
Hsieh, Tien-Yu
;
Chang, Ting-Chang
;
Chen, Te-Chih
;
Tsai, Ming-Yen
;
Chen, Yu-Te
;
Jian, Fu-Yen
;
Lin, Chia-Sheng
;
Tsai, Wu-Wei
;
Chiang, Wen-Jen
;
Yan, Jing-Yi
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
10-三月-2014
Investigation of on-current degradation behavior induced by surface hydrolysis effect under negative gate bias stress in amorphous InGaZnO thin-film transistors
Liu, Kuan-Hsien
;
Chang, Ting-Chang
;
Chang, Kuan-Chang
;
Tsai, Tsung-Ming
;
Hsieh, Tien-Yu
;
Chen, Min-Chen
;
Yeh, Bo-Liang
;
Chou, Wu-Ching
;
電子物理學系
;
Department of Electrophysics
1-七月-2011
NBTI Degradation in LTPS TFTs Under Mechanical Tensile Strain
Lin, Chia-Sheng
;
Chen, Ying-Chung
;
Chang, Ting-Chang
;
Jian, Fu-Yen
;
Hsu, Wei-Che
;
Kuo, Yuan-Jui
;
Dai, Chih-Hao
;
Chen, Te-Chih
;
Lo, Wen-Hung
;
Hsieh, Tien-Yu
;
Shih, Jou-Miao
;
電子工程學系及電子研究所
;
Department of Electronics Engineering and Institute of Electronics
26-十一月-2012
The suppressed negative bias illumination-induced instability in In-Ga-Zn-O thin film transistors with fringe field structure
Chen, Yu-Chun
;
Chang, Ting-Chang
;
Li, Hung-Wei
;
Hsieh, Tien-Yu
;
Chen, Te-Chih
;
Wu, Chang-Pei
;
Chou, Cheng-Hsu
;
Chung, Wang-Cheng
;
Chang, Jung-Fang
;
Tai, Ya-Hsiang
;
光電工程學系
;
Department of Photonics