瀏覽 的方式: 作者 Hsu, Chih-Chieh

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1-一月-1970Effect of Annealing Treatment on Performance of Ga2O3 Conductive-Bridging Random-Access MemoryGan, Kai-Jhih; Liu, Po-Tsun; Ruan, Dun-Bao; Hsu, Chih-Chieh; Chiu, Yu-Chuan; Sze, Simon M.; 電子工程學系及電子研究所; 光電工程學系; 光電工程研究所; Department of Electronics Engineering and Institute of Electronics; Department of Photonics; Institute of EO Enginerring
1-一月-2019Ferroelectric Characterization of Hafnium-Oxide-Based Ferroelectric Memories with Remote Nitrogen Plasma TreatmentsLee, You-Ting; Chen, Hsuan-Han; Tung, Yi-Chun; Shih, Bing-Yang; Hsiung, Szu-Yen; Lee, Tsung-Ming; Hsu, Chih-Chieh; Liu, Chien; Hsu, Hsiao-Hsuan; Chang, Chun-Yen; Lan, Yu-Pin; Cheng, Chun-Hu; 交大名義發表; 電子物理學系; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
5-十二月-2018Improved Thermal Stability and Stress Immunity in Highly Scalable Junctionless FETs Using Enhanced-Depletion ChannelsLiu, Chien; Cheng, Chun-Hu; Lin, Ming-Huei; Shih, Yi-Jia; Hung, Yu-Wen; Fan, Chia-Chi; Chen, Hsuan-Han; Chen, Wan-Hsin; Hsu, Chih-Chieh; Shih, Bing-Yang; Chiu, Yu-Chien; Chou, Wu-Ching; Hsu, Hsiao-Hsuan; Chang, Chun-Yen; 電子物理學系; 電子工程學系及電子研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
2013Investigation of Gate Oxide Short in FinFETs and the Test Methods for FinFET SRAMsLin, Chen-Wei; Chao, Mango C. -T.; Hsu, Chih-Chieh; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-二月-2019Investigation of Gate-Stress Engineering in Negative Capacitance FETs Using Ferroelectric Hafnium Aluminum OxidesCheng, Chun-Hu; Fan, Chia-Chi; Liu, Chien; Hsu, Hsiao-Hsuan; Chen, Hsuan-Han; Hsu, Chih-Chieh; Wang, Shih-An; Chang, Chun-Yen; 電子物理學系; 電子工程學系及電子研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
1-一月-2019Investigation of Phase Transformation in HfO2 Ferroelectric Capacitor by Means of a ZrO2 Capping LayerLiu, Kuan-Wei; Chen, Hsuan-Han; Huang, Zhong-Ying; Wang, Wei-Chun; Fan, Yu-Chi; Lin, Ching-Liang; Hsu, Chih-Chieh; Fan, Chia-Chi; Hsu, Hsiao-Hsuan; Chang, Chun-Yen; Lin, Chien-Chung; Cheng, Chun-Hu; 交大名義發表; 電子物理學系; 電子工程學系及電子研究所; National Chiao Tung University; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
1-一月-2019Negative Capacitance CMOS Field-Effect Transistors with Non-Hysteretic Steep Sub-60mV/dec Swing and Defect-Passivated Multidomain SwitchingLiu, Chien; Chen, Hsuan-Han; Hsu, Chih-Chieh; Fan, Chia-Chi; Hsu, Hsiao-Hsuan; Cheng, Chun-Hu; 電子物理學系; 電子工程學系及電子研究所; Department of Electrophysics; Department of Electronics Engineering and Institute of Electronics
1-六月-2014Novel Circuit-Level Model for Gate Oxide Short and its Testing Method in SRAMsLin, Chen-Wei; Chao, Mango C. -T.; Hsu, Chih-Chieh; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
4-五月-2020Role of tungsten dopants in indium oxide thin-film transistor on radiation hardness technologyRuan, Dun-Bao; Liu, Po-Tsun; Gan, Kai-Jhih; Chiu, Yu-Chuan; Hsu, Chih-Chieh; Sze, Simon M.; 電子工程學系及電子研究所; 光電工程學系; 光電工程研究所; Department of Electronics Engineering and Institute of Electronics; Department of Photonics; Institute of EO Enginerring
2009應用雷射繞射儀從事光學折射率與粒子直徑之量測許智傑; Hsu, Chih-Chieh; 呂宗熙; Liu, Tzong-Shi; 機械工程學系
2015適用於車載產品之高信賴性閘極驅動電路研究許志傑; 劉柏村; Hsu, Chih-Chieh; Liu, Po-Tsun; 電機學院電子與光電學程