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公開日期標題作者
1-九月-2017Device Instability of ReRAM and a Novel Reference Cell Design for Wide Temperature Range OperationLin, Y. H.; Lin, Y. Y.; Lee, F. M.; Ho, Y. H.; Hsu, K. C.; Lee, M. H.; Lee, D. Y.; Chiang, K. H.; Yang, C. C.; Li, C. H.; Wu, S. W.; Lei, C. Y.; Lin, C. M.; Chen, C. J.; Chen, K. H.; Lung, H. L.; Wang, K. C.; Tseng, T. Y.; Lu, C. Y.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010Higher kappa Metal-Gate/High-kappa/Ge n-MOSFETs with < 1 nm EOT Using Laser AnnealingChen, W. B.; Shie, B. S.; Chin, Albert; Hsu, K. C.; Chi, C. C.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-2010Improved Capacitance Density and Reliability of High-k Ni/ZrO(2)/TiN MIM Capacitors Using Laser-Annealing TechniqueTsai, C. Y.; Chiang, K. C.; Lin, S. H.; Hsu, K. C.; Chi, C. C.; Chin, Albert; 電機工程學系; Department of Electrical and Computer Engineering
1-七月-2010Improved Capacitance Density and Reliability of High-k Ni/ZrO2/TiN MIM Capacitors Using Laser-Annealing TechniqueTsai, C. Y.; Chiang, K. C.; Lin, S. H.; Hsu, K. C.; Chi, C. C.; Chin, Albert; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2008Self-protection multi-ring-architecture fiber sensing systemWang, C. H.; Yeh, C. H.; Shih, F. Y.; Chow, C. W.; Hsu, K. C.; Lai, Y.; Chi, S.; 光電工程學系; Department of Photonics
1-九月-2006Surface roughness of sputtered ZnO filmsLin, Y. S.; Hsu, K. C.; Huang, Y. M.; 光電工程學系; Department of Photonics