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公開日期標題作者
1-十二月-2010Analysis of Degradation Mechanism in SONOS-TFT Under Hot-Carrier OperationChen, Te-Chih; Chang, Ting-Chang; Chen, Shih-Ching; Hsieh, Tien-Yu; Jian, Fu-Yen; Lin, Chia-Sheng; Li, Hung-Wei; Lee, Ming-Hsien; Chen, Jim-Shone; Shih, Ching-Chieh; 光電工程學系; Department of Photonics
1-三月-2011Charge-Trapping-Induced Parasitic Capacitance and Resistance in SONOS TFTs Under Gate Bias StressLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Li, Hung-Wei; Chen, Shih-Ching; Chuang, Ying-Shao; Chen, Te-Chih; Tai, Ya-Hsiang; Lee, Ming-Hsien; Chen, Jim-Shone; 光電工程學系; Department of Photonics
1-十月-2011Effect of Lateral Body Terminal on Silicon-Oxide-Nitride-Oxide-Silicon Thin-Film TransistorsLi, Hung-Wei; Chang, Ting-Chang; Chang, Geng-Wei; Lin, Chia-Sheng; Tsai, Tsung-Ming; Jian, Fu-Yen; Tai, Ya-Hsiang; Lee, Ming-Hsien; 電子工程學系及電子研究所; 光電工程學系; 顯示科技研究所; Department of Electronics Engineering and Institute of Electronics; Department of Photonics; Institute of Display
1-九月-2007Effective density-of-states distribution of polycrystalline silicon thin-film transistors under hot-carrier degradationLee, Ming-Hsien; Chang, Kai-Hsiang; Lin, Horng-Chih; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2006Fabrication and characterization of nanowire transistors with solid-phase crystallized poly-Si channelsLin, Horng-Chih; Lee, Ming-Hsien; Su, Chun-Jung; Shen, Shih-Wen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十一月-2009First Principles Calculations of Linear and Second-Order Optical Responses in Rhombohedrally Distorted Perovskite Ternary Halides, CsGeX(3) (X = Cl, Br, and I)Tang, Li-Chuan; Chang, Yia-Chung; Huang, Jung-Yau; Lee, Ming-Hsien; Chang, Chen-Shiung; 光電工程學系; Department of Photonics
1-十一月-2009First Principles Calculations of Linear and Second-Order Optical Responses in Rhombohedrally Distorted Perovskite Ternary Halides, CsGeX3 (X = Cl, Br, and I)Tang, Li-Chuan; Chang, Yia-Chung; Huang, Jung-Yau; Lee, Ming-Hsien; Chang, Chen-Shiung; 光電工程學系; 光電工程研究所; Department of Photonics; Institute of EO Enginerring
1-三月-2007Spatially and temporally resolving the degradation of n-channel poly-Si thin-film transistors under hot-carrier stressingLee, Ming-Hsien; Chang, Kai-Hsiang; Lin, Horng-Chih; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2007Spatially resolving the degradation of SPC thin-film transistors under AC stressChang, Kai-Hsiang; Lee, Ming-Hsien; Lin, Horng-Chih; Huang, Tiao-Yuan; Lee, Yao-Jen; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2010Unusual Threshold Voltage Shift Caused by Self-Heating-Induced Charge Trapping EffectJian, Fu-Yen; Chang, Ting-Chang; Chu, An-Kuo; Chen, Te-Chih; Chen, Shih-Ching; Lin, Chia-Sheng; Li, Hung-Wei; Lee, Ming-Hsien; Chen, Jim-Shone; Shih, Ching-Chieh; 光電工程學系; Department of Photonics
顯示 1 到 10 筆資料，總共 10 筆