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公開日期標題作者
31-三月-2011Influence of hydrogen plasma treatment on charge storage characteristics in high density tungsten nanocrystal nonvolatile memoryChen, Shih-Cheng; Chang, Ting-Chang; Chen, Wei-Ren; Lo, Yuan-Chun; Wu, Kai-Ting; Sze, S. M.; Chen, Jason; Liao, I. H.; Yeh (Huang), Fon-Shan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2010Nonvolatile memory effect of tungsten nanocrystals under oxygen plasma treatmentsChen, Shih-Cheng; Chang, Ting-Chang; Chen, Wei-Ren; Lo, Yuan-Chun; Wu, Kai-Ting; Sze, S. M.; Chen, Jason; Liao, I. H.; Yeh(Huang), Fon-Shan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-十月-2010Nonvolatile memory effect of tungsten nanocrystals under oxygen plasma treatmentsChen, Shih-Cheng; Chang, Ting-Chang; Chen, Wei-Ren; Lo, Yuan-Chun; Wu, Kai-Ting; Sze, S. M.; Chen, Jason; Liao, I. H.; Yeh(Huang), Fon-Shan; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
3-十二月-2007Tungsten nanocrystal memory devices improved by supercritical fluid treatmentChen, C. H.; Chang, T. C.; Liao, I. H.; Xi, P. B.; Tsai, C. T.; Yang, P. Y.; Hsieh, Joe; Chen, Jason; Chen, U. S.; Chen, J. R.; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
7-一月-2008Tungsten oxide/tungsten nanocrystals for nonvolatile memory devicesChen, C. H.; Chang, T. C.; Liao, I. H.; Xi, P. B.; Hsieh, Joe; Chen, Jason; Huang, Tensor; Sze, S. M.; Chen, U. S.; Chen, J. R.; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
顯示 1 到 5 筆資料，總共 5 筆