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公開日期標題作者
2010Analysis of Anomalous Capacitance Induced by TAGIDL in p-Channel LTPS TFTsLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Ching; Jian, Fu-Yen; Chuang, Ying-Shao; Chen, Te-Chih; Chen, Yu-Chun; Tai, Ya-Hsiang; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-十二月-2010Analysis of Degradation Mechanism in SONOS-TFT Under Hot-Carrier OperationChen, Te-Chih; Chang, Ting-Chang; Chen, Shih-Ching; Hsieh, Tien-Yu; Jian, Fu-Yen; Lin, Chia-Sheng; Li, Hung-Wei; Lee, Ming-Hsien; Chen, Jim-Shone; Shih, Ching-Chieh; 光電工程學系; Department of Photonics
1-十一月-2009Anomalous Capacitance Induced by GIDL in P-Channel LTPS TFTsLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Chen, Shih-Ching; Jian, Fu-Yen; Li, Hung-Wei; Chen, Te-Chih; Weng, Chi-Feng; Lu, Jin; Hsu, Wei-Che; 光電工程學系; Department of Photonics
21-三月-2011Anomalous on-current and subthreshold swing improvement in low-temperature polycrystalline-silicon thin-film transistors under Gate bias stressLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Li, Hung-Wei; Chen, Yi-Chuan; Chen, Te-Chih; Tai, Ya-Hsiang; 電子工程學系及電子研究所; 光電工程學系; 顯示科技研究所; Department of Electronics Engineering and Institute of Electronics; Department of Photonics; Institute of Display
1-三月-2011Charge-Trapping-Induced Parasitic Capacitance and Resistance in SONOS TFTs Under Gate Bias StressLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Li, Hung-Wei; Chen, Shih-Ching; Chuang, Ying-Shao; Chen, Te-Chih; Tai, Ya-Hsiang; Lee, Ming-Hsien; Chen, Jim-Shone; 光電工程學系; Department of Photonics
2010Degradation of Low Temperature Polycrystalline Silicon Thin Film Transistors under Negative Bias Temperature Instability Stress with Illumination EffectLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Hsu, Wei-Che; Chen, Shih-Ching; Tai, Ya-Hsiang; Jian, Fu-Yen; Chen, Te-Chih; Tu, Kuan-Jen; Wu, Hsing-Hua; Chen, Yi-Chan; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
1-十月-2011Effect of Lateral Body Terminal on Silicon-Oxide-Nitride-Oxide-Silicon Thin-Film TransistorsLi, Hung-Wei; Chang, Ting-Chang; Chang, Geng-Wei; Lin, Chia-Sheng; Tsai, Tsung-Ming; Jian, Fu-Yen; Tai, Ya-Hsiang; Lee, Ming-Hsien; 電子工程學系及電子研究所; 光電工程學系; 顯示科技研究所; Department of Electronics Engineering and Institute of Electronics; Department of Photonics; Institute of Display
20-八月-2016Enhanced reactivity of metal/metal oxide-porous carbon nanocomposites for electrochemical and photocatalytic applicationsDoong, Ruey-An; Lin, Chia-Sheng; Bindumadhavan, Kartick; 環境工程研究所; Institute of Environmental Engineering
2009Illumination-Assisted Negative Bias Temperature Instability Degradation in Low Temperature Polycrystalline Silicon Thin-Film TransistorsLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Hsu, Wei-Che; Chen, Shih-Ching; Li, Hung-Wei; Tu, Kuan-Jen; Jian, Fu-Yen; Chen, Te-Chih; 光電工程學系; Department of Photonics
11-七月-2011Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistorChen, Te-Chih; Chang, Ting-Chang; Hsieh, Tien-Yu; Lu, Wei-Siang; Jian, Fu-Yen; Tsai, Chih-Tsung; Huang, Sheng-Yao; Lin, Chia-Sheng; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-九月-2013Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environmentsHsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-七月-2011NBTI Degradation in LTPS TFTs Under Mechanical Tensile StrainLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Hsu, Wei-Che; Kuo, Yuan-Jui; Dai, Chih-Hao; Chen, Te-Chih; Lo, Wen-Hung; Hsieh, Tien-Yu; Shih, Jou-Miao; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2012Oxygen-Adsorption-Induced Anomalous Capacitance Degradation in Amorphous Indium-Gallium-Zinc-Oxide Thin-Film-Transistors under Hot-Carrier StressChung, Wan-Fang; Chang, Ting-Chang; Lin, Chia-Sheng; Tu, Kuan-Jen; Li, Hung-Wei; Tseng, Tseung-Yuen; Chen, Ying-Chung; Tai, Ya-Hsiang; 電子工程學系及電子研究所; 光電工程學系; 顯示科技研究所; Department of Electronics Engineering and Institute of Electronics; Department of Photonics; Institute of Display
2011Transient Effect Assisted NBTI Degradation in p-Channel LTPS TFTs under Dynamic StressLin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Ching; Hsu, Wei-Che; Jian, Fu-Yen; Chen, Te-Chih; Tai, Ya-Hsiang; 光電工程學系; 顯示科技研究所; Department of Photonics; Institute of Display
2010Unusual Threshold Voltage Shift Caused by Self-Heating-Induced Charge Trapping EffectJian, Fu-Yen; Chang, Ting-Chang; Chu, An-Kuo; Chen, Te-Chih; Chen, Shih-Ching; Lin, Chia-Sheng; Li, Hung-Wei; Lee, Ming-Hsien; Chen, Jim-Shone; Shih, Ching-Chieh; 光電工程學系; Department of Photonics
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