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公開日期標題作者
20113DICE: 3D IC Cost Evaluation Based on Fast Tier Number EstimationChan, Cheng-Chi; Yu, Yen-Ting; Jiang, Iris Hui-Ru; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2012Accurate Process-Hotspot Detection Using Critical Design Rule ExtractionYu, Yen-Ting; Chan, Ya-Chung; Sinha, Subarna; Jiang, Iris Hui-Ru; Chiang, Charles; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2008Configurable Rectilinear Steiner Tree Construction for SoC and Nano TechnologiesJiang, Iris Hui-Ru; Yu, Yen-Ting; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2014DRC-Based Hotspot Detection Considering Edge Tolerance and Incomplete SpecificationYu, Yen-Ting; Jiang, Iris Hui-Ru; Zhang, Yumin; Chiang, Charles; 交大名義發表; National Chiao Tung University
1-一月-2017iClaire: A Fast and General Layout Pattern Classification AlgorithmChang, Wei-Chun; Jiang, Iris Hui-Ru; Yu, Yen-Ting; Liu, Wei-Fang; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
1-三月-2015Machine-Learning-Based Hotspot Detection Using Topological Classification and Critical Feature ExtractionYu, Yen-Ting; Lin, Geng-He; Jiang, Iris Hui-Ru; Chiang, Charles; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2013Machine-Learning-Based Hotspot Detection Using Topological Classification and Critical Feature ExtractionYu, Yen-Ting; Lin, Geng-He; Jiang, Iris Hui-Ru; Chiang, Charles; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2008UNIFICATION OF OBSTACLE-AVOIDING RECTILINEAR STEINER TREE CONSTRUCTIONJiang, Iris Hui-Ru; Lin, Shung-Wei; Yu, Yen-Ting; 電子工程學系及電子研究所; Department of Electronics Engineering and Institute of Electronics
2015新穎的微影技術製程熱點偵測平臺余彥廷; Yu, Yen-Ting; 江蕙如; Jiang, Hui-Ru; 電子工程學系 電子研究所
2008系統晶片及奈米技術下直角史坦那樹之建構余彥廷; Yu, Yen-Ting; 江蕙如; Jiang, Hui-Ru; 電子研究所