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公開日期標題作者
1-六月-2018Enhanced stability of thin film transistors with double-stacked amorphous IWO/IWO:N channel layerLin, Dong; Pi, Shubin; Yang, Jianwen; Tiwari, Nidhi; Ren, Jinhua; Zhang, Qun; Liu, Po-Tsun; Shieh, Han-Ping; 顯示科技研究所; Institute of Display
21-三月-2018The Influence of Annealing Temperature on Amorphous Indium-Zinc-Tungsten Oxide Thin-Film TransistorsFu, Ruofan; Yang, Jianwen; Chang, Wei-Chiao; Chang, Wei-Cheng; Chang, Chien-Min; Lin, Dong; Zhang, Qun; Liu, Po-Tsun; Shieh, Han-Ping D.; 光電工程學系; Department of Photonics
十二月-2016Influences of Nitrogen Doping on the Electrical Characteristics of Indium-Zinc-Oxide Thin Film TransistorsHan, Yanbing; Yan, Hai; Tsai, Yun-Chu; Li, Yan; Zhang, Qun; Shieh, Han-Ping D.; 光電工程學系; Department of Photonics
四月-2016Stability of Amorphous Indium-Tungsten Oxide Thin-Film Transistors Under Various Wavelength Light IlluminationYang, Zhao; Meng, Ting; Zhang, Qun; Shieh, Han-Ping D.; 光電工程學系; Department of Photonics
1-二月-2017Stability study of indium tungsten oxide thin-film transistors annealed under various ambient conditionsQu, Mingyue; Chang, Chih-Hsiang; Meng, Ting; Zhang, Qun; Liu, Po-Tsun; Shieh, Han-Ping D.; 光電工程學系; Department of Photonics
顯示 1 到 5 筆資料，總共 5 筆