| 標題: | 後次微米時代新興電子設計自動化技術之研究---子計畫四：應用計算智慧推理處理後深次微米時代電路設計上的可靠度挑戰(III) Coping with Reliability Challenges to Circuit Designs beyond Deep Sub-Micron Era by Computational Intelligence Reasoning (III) |
| 作者: | 溫宏斌 Wen Charles H.-P. 國立交通大學電信工程學系（所） |
| 關鍵字: | 軟性電子錯誤率;製程變異;支持向量回歸;蒙地卡羅;統計靜態時序分析;soft error;process variation;SVM;Monte Carlo;SSTA |
| 公開日期: | 2010 |
| 官方說明文件#: | NSC99-2220-E009-011 |
| URI: | http://hdl.handle.net/11536/100244 https://www.grb.gov.tw/search/planDetail?id=2159110&docId=347485 |
| Appears in Collections: | Research Plans |
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