標題: 電子資訊產業供應鏈管理---IC製造業前置時間管理之研究(III)
The Study of Lead Time Management for IC Industry (III)
作者: 彭文理
WEN LEAPEARN
交通大學工業工程與管理系
關鍵字: 測試廠;晶圓測試;交期績效;緊急批量;相依整備時間;Testing factory;Wafer probing;Delivery performance;Rush lot;Sequence dependent setup time
公開日期: 2000
官方說明文件#: NSC89-2213-E009-034
URI: http://hdl.handle.net/11536/101282
https://www.grb.gov.tw/search/planDetail?id=525216&docId=95516
Appears in Collections:Research Plans


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