| 標題: | 先進製程技術之設計與可靠度提昇研究---子計畫三：在後佈局與測試設計所使用之良率改善技術研究(III) Yield Improvement Methodologies in Post-Layout Design Flow and Design for Test(III) |
| 作者: | 陳宏明 Chen Hung-Ming 國立交通大學電子工程學系及電子研究所 |
| 公開日期: | 2008 |
| 官方說明文件#: | NSC97-2220-E009-004 |
| URI: | http://hdl.handle.net/11536/101956 https://www.grb.gov.tw/search/planDetail?id=1689493&docId=291412 |
| Appears in Collections: | Research Plans |
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